Patent Assignment
Reel/Frame 062349/0129
Assignment of Assignor's Interest
Recorded: 2023-01-11
Pages: 7
Assignors
LEE, JAEYONG
Executed: 2022-12-01
KWAK, HIDONG
Executed: 2022-11-28
SHIN, MINJUNG
Executed: 2022-11-25
OH, SEUNGRYEOL
Executed: 2022-11-28
LEE, CHUHEE
Executed: 2022-11-30
HWANG, BYUNGHYUN
Executed: 2022-12-02
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, GYEONGGI-DO, SUWON-SI, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Semiconductor Device Measurement Method Using X-Ray Scattering and Semiconductor Device Manufacturing Method Including the Measurement Method