Semiconductor device measurement method using x-ray scattering and semiconductor device manufacturing method including the measurement method
A semiconductor device measurement method using X-ray scattering includes preparing a semiconductor device including a repeat structure, irradiating X-rays onto the semiconductor device to obtain a first X-ray scattering image, calculating a second X-ray scattering image through simulation, the second X-ray scattering image corresponding to a target repeat structure for the semiconductor device, generating a repeat structure mask by analyzing a position of a signal for a regular repeat structure from the second X-ray scattering image, removing the repeat structure mask from the first X-ray scattering image and generating an error image; and analyzing the error image and calculating irregularities for the repeat structure of the semiconductor device.
1. A semiconductor device measurement method using X-ray scattering, the semiconductor device measurement method comprising:
preparing a semiconductor device including a repeat structure;
irradiating X-rays onto the semiconductor device to obtain a first X-ray scattering image;
calculating a second X-ray scattering image through simulation, the second X-ray scattering image corresponding to a target repeat structure for the semiconductor device;
generating a repeat structure mask by analyzing a position of a signal for a regular repeat structure from the second X-ray scattering image;
removing the repeat structure mask from the first X-ray scattering image and generating an error image; and
analyzing the error image and calculating irregularities for the repeat structure of the semiconductor device.
2. The semiconductor device measurement method of claim 1 , wherein the calculating irregularities comprises calculating a structural dispersion in a field of view (FoV).
3. The semiconductor device measurement method of claim 1 , wherein the calculating irregularities comprises quantifying the irregularities with respect to the error image.
4. The semiconductor device measurement method of claim 3 , wherein the irregularities are quantified as an average value with respect to a distance based on a center of the error image, or the irregularities are quantified as a value obtained by applying a weight to the distance based on the center of the error image.
5. The semiconductor device measurement method of claim 4 , further comprising managing a process dispersion of the semiconductor device based on the quantified irregularities.
6. The semiconductor device measurement method of claim 1 , wherein
the first X-ray scattering image and the second X-ray scattering image are brightest in respective centers thereof due to a diffraction phenomenon, and
a signal portion due to irregularities is maintained in the error image.
7. The semiconductor device measurement method of claim 1 , wherein the repeat structure comprises a high aspect ratio (HAR) structure.
8. The semiconductor device measurement method of claim 1 , wherein the repeat structure comprises a storage node of a dynamic random access memory (DRAM), or a channel hole of a vertical NAND (VNAND).
9. The semiconductor device measurement method of claim 1 , wherein the first X-ray scattering image and the second X-ray scattering image are obtained by using a small angle X-ray scattering (SAXS) measurement device.
10. The semiconductor device measurement method of claim 1 , wherein the preparing comprises preparing a wafer including a plurality of semiconductor devices.
11. A semiconductor device measurement method comprising:
loading a wafer into a small-angle X-ray scattering (SAXS) measurement device;
measuring a semiconductor device in the wafer with the SAXS measurement device;
storing a first X-ray scattering image for the semiconductor device;
modeling a target repeat structure for the semiconductor device;
analyzing X-rays with respect to the modeled target repeat structure;
storing a second X-ray scattering image with respect to the target repeat structure; and
removing the second X-ray scattering image from the first X-ray scattering image and calculating structural irregularities of a repeat structure of the semiconductor device in an X-ray measurement field of view (FoV),
wherein the irregularities represent a difference between an actual repeat structure of the semiconductor device and the target repeat structure.
12. The semiconductor device measurement method of claim 11 , wherein the storing of the first X-ray scattering image is performed separately from the storing of the second X-ray scattering image, and
the calculating the structural irregularities comprises calculating structural dispersion in the FoV.
13. The semiconductor device measurement method of claim 11 , wherein the calculating the structural irregularities comprises numerically quantifying the structural irregularities.
14. The semiconductor device measurement method of claim 13 , wherein the structural irregularities are quantified as an average value of a distance from a center with respect to an image in the X-ray measurement FoV, or the structural irregularities are quantified as a value obtained by applying a weight to the distance from the center.
15. The semiconductor device measurement method of claim 11 , wherein the repeat structure comprises a high aspect ratio (HAR) structure.
16. A semiconductor device manufacturing method comprising:
preparing a semiconductor device including a repeat structure;
irradiating X-rays onto the semiconductor device to obtain a first X-ray scattering image;
calculating a second X-ray scattering image through simulation, the second X-ray scattering image corresponding to a target repeat structure for the semiconductor device;
generating a repeat structure mask from the second X-ray scattering image by analyzing a position of a signal for a regular repeat structure;
removing the repeat structure mask from the first X-ray scattering image and generating an error image;
analyzing the error image and calculating irregularities for the repeat structure of the semiconductor device; and
applying the irregularities to a process dispersion management of the semiconductor device.
17. The semiconductor device manufacturing method of claim 16 , wherein the calculating irregularities comprises quantifying the irregularities with respect to the error image by calculating structural dispersion in a field of view (FoV).
18. The semiconductor device manufacturing method of claim 17 , wherein the irregularities are quantified as an average value with respect to a distance based on a center of the error image, or the irregularities are quantified as a value obtained by applying a weight to the distance based on the center of the error image.
19. The semiconductor device manufacturing method of claim 16 , wherein the semiconductor device is a dynamic random access memory (DRAM) or a vertical NAND (VNAND), and the DRAM or the VNAND have a high aspect ratio structure.
20. The semiconductor device manufacturing method of claim 16 , wherein:
the first X-ray scattering image and the second X-ray scattering image are brightest in respective centers thereof due to a diffraction phenomenon, and are obtained using a SAXS measurement device, and
a signal portion due to irregularities is maintained in the error image.