Patent Assignment
Reel/Frame 062805/0107
Assignment of Assignor's Interest
Recorded: 2023-02-27
Pages: 4
Assignors
JUNG, JONG SEOK
Executed: 2023-02-20
KWON, CHAN KEUN
Executed: 2023-02-20
KIM, JONG SEOK
Executed: 2023-02-20
LEE, YOUNG KWAN
Executed: 2023-02-20
Assignee
SK HYNIX INC.
2091, GYEONGCHUNG-DAERO, BUBAL-EUB, ICHEON-SI, GYEONGGI-DO, 17336, KOREA, REPUBLIC OF
Covered Property
(1)
Test Circuit of Semiconductor Apparatus and Test System Including the Same