IP Library › Assignment 064041/0660
Patent Assignment
Reel/Frame 064041/0660

Assignment of Assignor's Interest

Recorded: 2023-06-23 Pages: 4
Assignors
AHI, KIARASH
Executed: 2023-06-22
FENGER, GERMAIN LOUIS
Executed: 2023-06-09
Assignee
SIEMENS INDUSTRY SOFTWARE INC.
5800 GRANITE PARKWAY, SUITE 600, PLANO, TEXAS, 75024
Covered Property (1)
Wafer Image Defect Detection and Characterization for Manufacturing Process Calibration
Application: 17/823,235 →
Publication: US 2024/0070846
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 13, 2023
From: WU, HSIN-WEI
To: SIEMENS INDUSTRY SOFTWARE NV
Reel/Frame 064891/0994 →
Assignment of Assignor's Interest Sep 13, 2023
From: SIEMENS INDUSTRY SOFTWARE NV
To: SIEMENS INDUSTRY SOFTWARE LIMITED
Reel/Frame 064892/0309 →
Assignment of Assignor's Interest Sep 13, 2023
From: SIEMENS INDUSTRY SOFTWARE LIMITED
To: SIEMENS INDUSTRY SOFTWARE INC.
Reel/Frame 064892/0440 →