IP Library Assignment 064891/0994
Patent Assignment
Reel/Frame 064891/0994

Assignment of Assignor's Interest

Recorded: 2023-09-13 Pages: 4
Assignor
WU, HSIN-WEI
Executed: 2023-06-11
Assignee
SIEMENS INDUSTRY SOFTWARE NV
INTERLEUVENLAAN 68, LEUVEN, 3001, BELGIUM
Covered Property (1)
Wafer Image Defect Detection and Characterization for Manufacturing Process Calibration
Application: 17/823,235 →
Publication: US 2024/0070846
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jun 23, 2023
From: AHI, KIARASH; FENGER, GERMAIN LOUIS
To: SIEMENS INDUSTRY SOFTWARE INC.
Reel/Frame 064041/0660 →
Assignment of Assignor's Interest Sep 13, 2023
From: SIEMENS INDUSTRY SOFTWARE NV
To: SIEMENS INDUSTRY SOFTWARE LIMITED
Reel/Frame 064892/0309 →
Assignment of Assignor's Interest Sep 13, 2023
From: SIEMENS INDUSTRY SOFTWARE LIMITED
To: SIEMENS INDUSTRY SOFTWARE INC.
Reel/Frame 064892/0440 →