Patent Assignment
Reel/Frame 064449/0838
Assignment of Assignor's Interest
Recorded: 2023-08-01
Pages: 6
Assignors
JUNG, DAEHYUN
Executed: 2023-07-25
SIN, YUJEONG
Executed: 2023-07-25
JUNG, SUNGGON
Executed: 2023-07-25
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, GYEONGGI-DO, SUWON-SI, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Method of Inspecting Semiconductor Device