IP Library Assignment 065739/0682
Patent Assignment
Reel/Frame 065739/0682

Assignment of Assignor's Interest

Recorded: 2023-12-01 Pages: 8
Assignor
ASELTA NANOGRAPHICS
Executed: 2022-12-22
Assignee
APPLIED MATERIALS, INC.
3050 BOWERS AVENUE, SANTA CLARA, CALIFORNIA, 95054
Covered Properties (15)
Method for Correcting Electronic Proximity Effects Using Off-Center Scattering Functions
Patent: 9,224,577 →
Application: 13/587,598 →
Publication: US 2013/0043389
Free Form Fracturing Method for Electronic or Optical Lithography
Patent: 8,984,451 →
Application: 13/774,534 →
Publication: US 2014/0245240
Method of Correcting Electron Proximity Effects Using Voigt Type Scattering Functions
Patent: 9,934,336 →
Application: 13/861,284 →
Publication: US 2013/0275098
Method and System for Preparing a Pattern to Be Printed on a Plate or Mask by Electron Beam Lithography
Patent: 9,542,505 →
Application: 13/967,740 →
Publication: US 2014/0059503
Method for Estimating Patterns to Be Printed on a Plate or Mask by Means of Electron-Beam Lithography and Corresponding Printing Device
Patent: 9,430,597 →
Application: 14/100,484 →
Publication: US 2014/0180462
Method for Correcting Electronic Proximity Effects Using the Deconvolution of the Pattern to Be Exposed by Means of a Probabilistic Method
Patent: 9,223,926 →
Application: 14/344,671 →
Publication: US 2014/0344769
Lithography Method with Combined Optimization of the Radiated Energy and of the Geometry Applicable to Complex Shapes
Application: 14/783,756 →
Publication: US 2016/0079033
Method for the Correction of Electron Proximity Effects
Application: 14/915,288 →
Publication: US 2016/0211115
Method of Reducing Shot Count in Direct Writing by a Particle or Photon Beam
Application: 15/286,260 →
Publication: US 2017/0097571
Method for Calculating the Metrics of an Ic Manufacturing Process
Application: 15/310,709 →
Publication: US 2017/0123322
Method for Determining the Parameters of an Ic Manufacturing Process by a Differential Procedure
Application: 15/310,731 →
Publication: US 2017/0075225
Method for Determining the Parameters of an Ic Manufacturing Process Model
Application: 15/327,330 →
Publication: US 2017/0168401
Method of Applying Vertex Based Corrections to a Semiconductor Design
Application: 15/534,921 →
Publication: US 2018/0267399
Method of Performing Dose Modulation, in Particular for Electron Beam Lithography
Application: 15/742,003 →
Publication: US 2018/0204707
Method for Determining the Dose Corrections to Be Applied to an Ic Manufacturing Process by a Matching Procedure
Application: 15/763,829 →
Publication: US 2018/0203361
Related Assignments (15)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 4, 2012
From: SCHIAVONE, PATRICK; FIGUEIRO, THIAGO
To: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES; ASELTA NANOGRAPHICS
Reel/Frame 029400/0329 →
Assignment of Assignor's Interest Mar 5, 2013
From: TIPHINE, CHARLES; QUAGLIO, THOMAS; MARTIN, LUC
To: ASELTA NANOGRAPHICS
Reel/Frame 029925/0705 →
Assignment of Assignor's Interest Jun 5, 2013
From: TORTAI, JEAN-HERVE; SCHIAVONE, PATRICK; FIGUEIRO, THIAGO; JEDIDI, NADER
To: ASELTA NANOGRAPHICS
Reel/Frame 030552/0268 →
Assignment of Assignor's Interest Sep 9, 2013
From: BELLEDENT, JEROME
To: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES; ASELTA NANOGRAPHICS
Reel/Frame 031165/0696 →
Assignment of Assignor's Interest Jan 17, 2014
From: BELLEDENT, JEROME
To: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES; ASELTA NANOGRAPHICS
Reel/Frame 031996/0757 →
Assignment of Assignor's Interest Apr 11, 2014
From: SOULAN, SEBASTIEN
To: ASELTA NANOGRAPHICS
Reel/Frame 032660/0457 →
Assignment of Assignor's Interest Apr 11, 2014
From: SOULAN, SEBASTIEN
To: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
Reel/Frame 032660/0163 →
Assignment of Assignor's Interest Oct 9, 2015
From: TIPHINE, CHARLES; BAYLE, SEBASTIEN
To: ASELTA NANOGRAPHICS
Reel/Frame 036768/0352 →
Assignment of Assignor's Interest Apr 27, 2016
From: JEDIDI, NADER; SCHIAVONE, PATRICK; TORTAI, JEAN-HERVÉ; FIGUEIRO, THIAGO
To: ASELTA NANOGRAPHICS
Reel/Frame 038393/0881 →
Assignment of Assignor's Interest Nov 28, 2017
From: QUAGLIO, THOMAS; MILLEQUANT, MATHIEU; TIPHINE, CHARLES
To: ASELTA NANOGRAPHICS
Reel/Frame 044233/0954 →
Assignment of Assignor's Interest Nov 2, 2018
From: SCHIAVONE, PATRICK; FIGUEIRO, THIAGO
To: ASELTA NANOGRAPHICS
Reel/Frame 047399/0906 →
Assignment of Assignor's Interest Nov 26, 2018
From: FAY, AURÉLIEN; SCHIAVONE, PATRICK; FIGUEIRO, THIAGO
To: ASELTA NANOGRAPHICS; COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
Reel/Frame 047580/0876 →
Assignment of Assignor's Interest Apr 8, 2019
From: SCHIAVONE, PATRICK; FIGUEIRO, THIAGO
To: ASELTA NANOGRAPHICS
Reel/Frame 048817/0398 →
Assignment of Assignor's Interest Nov 26, 2019
From: SCHIAVONE, PATRICK; FIGUEIRO, THIAGO
To: ASELTA NANOGRAPHICS
Reel/Frame 051114/0355 →
Assignment of Assignor's Interest Jan 16, 2020
From: SCHIAVONE, PATRICK; FIGUEIRO, THIAGO; BAYLE, SÉBASTIEN
To: ASELTA NANOGRAPHICS
Reel/Frame 051533/0460 →