Lithography method with combined optimization of the radiated energy and of the geometry applicable to complex shapes
A method of generating data relative to the writing of a pattern by electronic radiation initially includes the provision of a pattern to be formed which form the work pattern with a single external envelope. The work pattern is broken down into a set of elementary outlines, each including a single external envelope. A set of insolation conditions is defined to model each elementary outline. An irradiated simulation pattern is calculated from the sets of insolation conditions associated with the sets of elementary outlines. The simulation pattern is compared with the pattern to be formed. If the simulation pattern is not representative of the pattern to be formed, shift vectors are calculated. The shift vectors are representative of different intervals existing between the two patterns. The external envelope of the pattern to be formed is modified from displacement vectors determined from the shift vectors. A new iteration is carried out.
1. A method of writing a pattern by electronic radiation, comprising the steps of:
S 1 ) providing a pattern to be formed on a substrate to a calculator;
S 2 ) forming a work pattern from the pattern to be formed, the work pattern comprising a single external envelope;
S 3 ) breaking down the work pattern into a set of elementary outlines comprising a plurality of elementary outlines each having a single external envelope, and defining a set of irradiation conditions for each elementary outline; and
S 4 ) comparing the pattern to be formed with a simulation pattern representing the sets of irradiation conditions for the elementary outlines to discriminate a simulation pattern representative of the pattern to be formed from a simulation pattern which is not representative of the pattern to be formed;
wherein, if the simulation pattern is not representative of the pattern to be formed, the method comprises the steps of:
S 7 ) determining at least one shift vector between at least a portion of the external envelope of the pattern to be formed and a corresponding portion of the external envelope of the simulation pattern;
S 8 ) displacing at least a portion of the external envelope of the work pattern or of the pattern to be formed according to a displacement vector determined at least from the corresponding shift vector to form a new work pattern; and
carrying out at least a new iteration of steps S 3 ) and S 4 ) before writing the pattern on the substrate using at least a final iteration of the work pattern,
the method further comprising: S 9 ) writing the pattern using at least the final iteration of the work pattern.
2. The method according to claim 1 , wherein during the step S 3 ), the first set of elementary outlines is configured to avoid an overlapping between two adjacent elementary outlines.
3. The method according to claim 1 , wherein during the step S 3 ), the positions of part of the elementary outlines are identical to the positions occupied by part of the elementary outlines of the previous iteration.
4. The method according to claim 1 , wherein during the step S 3 ), the shapes and the surfaces of part of the elementary outlines are identical to the shapes and to the surfaces of part of the elementary outlines of the previous iteration.
5. The method according to claim 1 , wherein the ratio of the number of elementary outlines forming the set of elementary outlines to the number of elementary outlines forming the set of elementary outlines during the breakdown step of the previous iteration is in the range from 0.8 to 1.2.
6. The method according to claim 1 , wherein after the step S 4 ), the work pattern is modified to becomes closer to the shape of the pattern to be formed.
7. The method according to claim 1 , wherein the work pattern has at least one flat edge and step S 7 ) is configured so that the new work pattern has the same flat edge.
8. A method of writing a pattern on a substrate by electronic radiation, comprising the steps of:
S 1 ) providing a pattern to be formed on a substrate to a calculator;
S 2 ) forming a work pattern from the pattern to be formed, the work pattern comprising a single external envelope;
S 3 ) breaking down the work pattern into a set of elementary outlines comprising a plurality of elementary outlines each having a single external envelope, and defining a set of irradiation conditions for each elementary outline; and
S 4 ) comparing the pattern to be formed with a simulation pattern representing the sets of irradiation conditions for the elementary outlines to discriminate a simulation pattern representative of the pattern to be formed from a simulation pattern which is not representative of the pattern to be formed;
wherein, if the simulation pattern is not representative of the pattern to be formed, the method comprises the steps of:
S 7 ) determining at least one shift vector between at least a portion of the external envelope of the pattern to be formed and a corresponding portion of the external envelope of the simulation pattern;
S 8 ) displacing at least a portion of the external envelope of the work pattern or of the pattern to be formed according to a displacement vector determined at least from the corresponding shift vector to form a new work pattern; and
carrying out a new iteration of steps S 3 ) and S 4 );
transmitting the sets of irradiation conditions of the last iteration to an electron gun control circuit before writing the pattern on the substrate using at least a final iteration of the work pattern,
the method further comprising: S 9 ) writing the pattern using at least the final iteration of the work pattern.
9. The method according to claim 8 , wherein during the step S 3 ), the first set of elementary outlines is configured to avoid an overlapping between two adjacent elementary outlines.
10. The method according to claim 8 , wherein the step S 3 ) comprises breaking down the work pattern into a set of elementary patterns, each elementary pattern defining a respective elementary outline.
11. The method according to claim 10 , wherein the elementary patterns have a non-zero surface that fills the working pattern.
12. A method of writing a pattern by electronic radiation, comprising successively:
S 1 ) providing a pattern to be formed on a substrate to a calculator;
S 2 ) forming a work pattern from the pattern to be formed, the work pattern comprising a single external envelope;
S 3 ) breaking down the work pattern into a set of elementary outlines comprising a plurality of elementary outlines each having a single external envelope, and defining a set of irradiation conditions for each elementary outline;
S 3 ′) computing a simulation pattern by means of the sets of irradiation conditions for the elementary outlines representing the work pattern, the simulation pattern taking into account diffusion of electron outside of each elementary outline;
S 4 ) comparing an external envelope of the pattern to be formed with an external envelope of the simulation pattern to discriminate a simulation pattern representative of the pattern to be formed from a simulation pattern which is not representative of the pattern to be formed;
wherein, if the simulation pattern is not representative of the pattern to be formed, the method comprises the steps of:
S 7 ) determining at least one shift vector between at least a portion of the external envelope of the pattern to be formed and a corresponding portion of a simulation external envelope of the simulation pattern;
S 8 ) displacing at least a portion of the external envelope of the working pattern according to a displacement vector determined at least from the corresponding shift vector to form a new work pattern; and
carrying out at least a new iteration of steps S 3 ), S 3 ′) and S 4 ) before writing the pattern on the substrate using at least a final iteration of the work pattern,
the method further comprising: S 9 ) writing the pattern using at least the final iteration of the work pattern.