IP Library › Assignment 066228/0092
Patent Assignment
Reel/Frame 066228/0092

Assignment of Assignor's Interest

Recorded: 2024-01-24 Pages: 3
Assignor
Assignee
OMNIMEASURE TECHNOLOGY INC.
BLDG.21, NO.195, SEC.4, CHUNG HSING RD., CHUTUNG, HSINCHU, TAIWAN
Covered Properties (3)
System and Method for via Structure Measurement
Patent: 8,139,233 →
Application: 12/725,930 →
Publication: US 2011/0172974
System, Method and Computer Readable Medium for Through Silicon via Structure Measurement
Patent: 8,699,021 →
Application: 13/105,493 →
Publication: US 2012/0197592
Measurement System
Patent: 9,752,866 →
Application: 14/983,053 →
Publication: US 2017/0146339
Related Assignments (3)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 18, 2010
From: KU, YI SHA; HSU, WEI TE; PANG, HSIU LAN; SHYU, DEH MING
To: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Reel/Frame 024099/0369 →
Assignment of Assignor's Interest Jun 16, 2011
From: KU, YI SHA; HSU, WEI TE
To: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Reel/Frame 026452/0685 →
Assignment of Assignor's Interest Jan 13, 2016
From: WEI, HSIANG-CHUN; LO, CHUN-WEI; WU, CHIEH-YU; CHO, CHIA-HUNG
To: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Reel/Frame 037512/0767 →