Patent Assignment
Reel/Frame 066975/0214
Assignment of Assignor's Interest
Recorded: 2024-04-02
Pages: 4
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Test Apparatus and Test Method for Detecting Defects of Elements Included in Integrated Circuit