Test apparatus and test method for detecting defects of elements included in integrated circuit
A test apparatus includes an input terminal, a first multiplexer, a plurality of first elements connected in series between the input terminal and the first multiplexer, and a processor. The first multiplexer is connected to each of a plurality of nodes between the plurality of first elements, and the processor is connected to the input terminal and to the first multiplexer. The processor inputs data to the plurality of first elements through the input terminal. The plurality of first elements outputs at least a portion of a plurality of pieces of data through the plurality of nodes between the elements to the first multiplexer. The processor may thereby determine whether a defect has occurred in any of the plurality of first elements by comparing data, output from the multiplexer, with an expected output value.
1 . A test apparatus comprising:
an input terminal;
a first multiplexer;
a plurality of first elements connected in series between the input terminal and the first multiplexer, the first multiplexer being connected to each node of a plurality of nodes among the plurality of first elements; and
a processor connected to the input terminal and the first multiplexer,
wherein
the processor is configured to:
provide input data to the plurality of first elements through the input terminal;
obtain output data from the first multiplexer, wherein the output data is based on node data being passed from the plurality of nodes to the first multiplexer as the input data is provided; and
determine whether a defect has occurred in one or more of the plurality of first elements by comparing the output data from the first multiplexer with one or more expected output values.
2 . The test apparatus of claim 1 , wherein
the processor is configured to:
cause first data, from a first node between a 1-1-th element and a 1-2-th element connected to the 1-1-th element, to pass to the first multiplexer as the input data; and
determine that a defect has occurred in the 1-1-th element, when the first data is different from a first expected output value.
3 . The test apparatus of claim 2 , wherein
the processor is configured to:
cause second data, from a second node between the 1-2-th element and a 1-3-th element connected to the 1-2-th element, to pass to the first multiplexer; and
determine that a defect has occurred in the 1-1-th element adjacent to the input terminal, when the first data is different from the first expected output value and the second data is different from a second expected output value.
4 . The test apparatus of claim 1 , wherein
the processor is configured to obtain the output data after a predetermined time has elapsed since the input data was provided to the plurality of first elements.
5 . The test apparatus of claim 4 , wherein
each first element of the plurality of first elements comprises flip-flop circuitry,
the test apparatus comprises a clock generator connected to each first element of the plurality of first elements, and
the processor is configured to provide a clock signal to each first element of the plurality of first elements through the clock generator for the predetermined time.
6 . The test apparatus of claim 1 , wherein
each first element of the plurality of first elements comprises at least a first internal path and a second internal path, and
the input data is transmitted to the first multiplexer through internal paths in each first element of the plurality of first elements, among the at least first internal path and the second internal path included in each of the plurality of first elements.
7 . The test apparatus of claim 6 , wherein
each first element of the plurality of first elements comprises an AND gate and comprises at least a first input port connected to the first internal path and a second input port connected to a second internal path, and
the processor is configured to provide a predetermined reference value through the first or the second input port whichever is not included in an electrical path connecting the input terminal to the first multiplexer.
8 . The test apparatus of claim 1 , further comprising
a plurality of second elements connected in series between the input terminal and a second multiplexer,
wherein
each node of a plurality of nodes among the plurality of second elements is connected to the second multiplexer, and
the processor is configured to:
provide the input data to the plurality of second elements through the input terminal;
obtain additional output data from the second multiplexer, wherein the additional output data is based on node data being passed from the plurality of nodes among the plurality of second elements to the second multiplexer as the input data is provided; and
compare the additional output data from the second multiplexer, with a second expected output value to determine whether a defect has occurred in each of the plurality of second elements.
9 . The test apparatus of claim 8 , wherein
each first element of the plurality of first elements is implemented as a first type of element, and
each second element of the plurality of second elements is implemented as a second type of element, the second type of element being different from the first type of element.
10 . The test apparatus of claim 8 , further comprising:
an output multiplexer connected to the first multiplexer and to the second multiplexer,
wherein
the processor is configured to control the output multiplexer to select either the first multiplexer or the second multiplexer.
11 . A test method of detecting defects of elements included in an integrated circuit, the test method comprising:
providing input data to a plurality of elements, connected in series in the integrated circuit, through an input terminal;
obtaining, as output data, at least a portion of a plurality of pieces of data that are output from a plurality of nodes among the plurality of elements as the input data is provided, from a multiplexer; and
determining whether a defect has occurred in each element of the plurality of elements by comparing the output data with an expected output value,
wherein inputs to the multiplexer are connected to the plurality of nodes among the plurality of elements or between a final element and the multiplexer.
12 . The test method of claim 11 , wherein
comparing the output data with the expected output value comprises determining that a defect has occurred in a first element, when a first data output from a first node between the first element and a second element is different from a first expected output value.
13 . The test method of claim 11 , wherein
obtaining the output data comprises obtaining the output data from the multiplexer after a predetermined time has elapsed since the input data was provided to the plurality of elements.
14 . The test method of claim 13 , wherein
each element of the plurality of elements comprises flip-flop circuitry, and
the test method comprises providing a clock signal to the plurality of elements through a clock generator connected to each of the plurality of elements for the predetermined time.
15 . The test method of claim 11 , wherein
determining whether the defect has occurred in each of the plurality of elements comprises determining that a defect has occurred in an element adjacent to the input terminal, among two or more continuous elements of the plurality of elements connected in series, when each of a plurality of pieces of data output from the two or more continuous elements is different from the expected output value.
16 . The test method of claim 11 , wherein
each element of the plurality of elements comprises at least a first internal path connected with a first input port and at least a second internal path connected with a second input port, and
providing the input data comprises:
providing the input data through input ports included in an electrical path connecting the input terminal to the multiplexer; and
providing a predetermined reference value through input ports which are not included in the electrical path.
17 . A system-on-chip comprising:
an integrated circuit comprising a plurality of elements connected in series;
an input terminal having one end connected to the plurality of elements;
a multiplexer having an input end connected to a plurality of nodes among the plurality of elements; and
a processor connected to the input terminal and the multiplexer,
wherein the processor is configured to:
provide input data to the plurality of elements through the input terminal;
obtain, as output data, at least a portion of a plurality of pieces of data that are output from the plurality of nodes as the input data is provided, from the multiplexer; and
determine whether a defect has occurred in each element of the plurality of elements by comparing the output data with an expected output value.
18 . The system-on-chip of claim 17 , wherein
the processor is configured to:
obtain first data, output from a first node between a first element and a second element that is connected to the first element as the input data is provided, from the multiplexer; and
determine that a defect has occurred in the first element, when the first data is different from a first expected output value.
19 . The system-on-chip of claim 18 , wherein
the processor is configured to determine that a defect has occurred in an element adjacent to the input terminal, among two or more continuous elements of the plurality of elements connected in series, when each of a plurality of pieces of data output from the two or more continuous elements is different from the expected output value.
20 . The system-on-chip of claim 17 , wherein
each element of the plurality of elements comprises flip-flop circuity,
the system-on-chip further comprises a clock generator connected to each element of the plurality of elements, and
the processor is configured to:
provide a clock signal to the plurality of elements through the clock generator for a predetermined time after the input data was provided; and
obtain at least a portion of a plurality of pieces of data, output from the plurality of nodes, from the multiplexer after the predetermined time has elapsed since the input data was provided.