IP Library Assignment 070193/0413
Patent Assignment
Reel/Frame 070193/0413

Change of Name

Recorded: 2024-12-20 Pages: 2
Assignor
Assignee
ZHONGHUAN ADVANCED (XUZHOU) SEMICONDUC TOR MATERIALS CO., LTD.
NO. 1 XINXIN ROAD, ECONOMIC AND TECHNOLOGICAL DEVELOPMENT ZONE, XUZHOU, JIANGSU, 221004, CHINA
Covered Property (1)
Method and System for Automatically Detecting and Controlling Defects on Wafer
Application: 17/609,419 →
Publication: US 2022/0223481
Related Assignments (5)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jun 8, 2023
From: XUZHOU XINJING SEMICONDUCTOR TECHNOLOGY CO., LTD.
To: ZHONGHUAN ADVANCED (XUZHOU) SEMICONDUCTOR MATERIALS CO., LTD.
Reel/Frame 063889/0983 →
Assignment of Assignor's Interest Jun 11, 2023
From: ZHONGHUAN ADVANCED (XUZHOU) SEMICONDUCTOR MATERIALS CO., LTD.
To: ZHONGHUAN ADVANCED SEMICONDUCTOR MATERIALS CO., LTD.
Reel/Frame 063916/0190 →
Assignment of Assignor's Interest Mar 5, 2025
From: ZHENG, JIAZHEN; CHEN, CHIEN-MING; LOW, KINPENG
To: XUZHOU XINJING SEMICONDUCTOR TECHNOLOGY CO., LTD.
Reel/Frame 070418/0481 →
Change of Name Mar 5, 2025
From: ZHONGHUAN ADVANCED SEMICONDUCTOR MATERIALS CO., LTD.
To: ZHONGHUAN ADVANCED SEMICONDUCTOR TECHNOLOGY CO., LTD.
Reel/Frame 070418/0581 →
Correction of Address of Assignee – Entered Incorrectly. Reel 070418, Frame 0581 Mar 13, 2025
From: ZHONGHUAN ADVANCED SEMICONDUCTOR MATERIALS CO., LTD.
To: ZHONGHUAN ADVANCED SEMICONDUCTOR TECHNOLOGY CO., LTD.
Reel/Frame 070499/0665 →