Patent Assignment
Reel/Frame 070418/0481
Assignment of Assignor's Interest
Recorded: 2025-03-05
Pages: 4
Assignors
ZHENG, JIAZHEN
Executed: 2021-08-31
CHEN, CHIEN-MING
Executed: 2021-08-31
LOW, KINPENG
Executed: 2021-09-03
Assignee
XUZHOU XINJING SEMICONDUCTOR TECHNOLOGY CO., LTD.
NO. 1 XINXIN ROAD, ECONOMIC AND TECHNOLOGICAL DEVELOPMENT ZONE, XUZHOU, 221004, CHINA
Covered Property
(1)
Method and System for Automatically Detecting and Controlling Defects on Wafer
Application:
17/609,419 →
Publication:
US 2022/0223481
Related Assignments
(5)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name
Jun 8, 2023
From: XUZHOU XINJING SEMICONDUCTOR TECHNOLOGY CO., LTD.
To: ZHONGHUAN ADVANCED (XUZHOU) SEMICONDUCTOR MATERIALS CO., LTD.
Reel/Frame 063889/0983 →
Assignment of Assignor's Interest
Jun 11, 2023
From: ZHONGHUAN ADVANCED (XUZHOU) SEMICONDUCTOR MATERIALS CO., LTD.
To: ZHONGHUAN ADVANCED SEMICONDUCTOR MATERIALS CO., LTD.
Reel/Frame 063916/0190 →
Change of Name
Dec 20, 2024
From: XUZHOU XINJING SEMI CONDUCTOR TECHNOLOG Y CO., LTD.
To: ZHONGHUAN ADVANCED (XUZHOU) SEMICONDUC TOR MATERIALS CO., LTD.
Reel/Frame 070193/0413 →
Change of Name
Mar 5, 2025
From: ZHONGHUAN ADVANCED SEMICONDUCTOR MATERIALS CO., LTD.
To: ZHONGHUAN ADVANCED SEMICONDUCTOR TECHNOLOGY CO., LTD.
Reel/Frame 070418/0581 →
Correction of Address of Assignee – Entered Incorrectly. Reel 070418, Frame 0581
Mar 13, 2025
From: ZHONGHUAN ADVANCED SEMICONDUCTOR MATERIALS CO., LTD.
To: ZHONGHUAN ADVANCED SEMICONDUCTOR TECHNOLOGY CO., LTD.
Reel/Frame 070499/0665 →