Patent Application
Utility
App. No. 09/760,704
· Confirmation No. 5851
METHOD OF PROCESSING A SEMICONDUCTOR DEVICE
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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| 2004-07-06 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-04-06 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 4 | View | |
| 2004-04-06 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-04-06 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-03-10 | FWCLM |
Index of Claims | 1 | View | |
| 2004-03-10 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2004-02-17 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2004-02-17 | SPEC |
Specification | 1 | View | |
| 2004-02-17 | CLM |
Claims | 10 | View | |
| 2004-02-17 | REM |
Applicant Arguments/Remarks Made in an Amendment | 3 | View | |
| 2004-02-17 | OATH |
Oath or Declaration filed | 4 | View | |
| 2004-02-17 | XT/ |
Extension of Time | 1 | View | |
| 2003-10-17 | CTNF |
Non-Final Rejection | 8 | View | |
| 2003-10-17 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-10-17 | SRFW |
Search information including classification, databases and other search related notes | 2 | View | |
| 2003-10-14 | DRW |
Drawings-only black and white line drawings | 1 | View | |
| 2003-09-15 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2003-09-15 | FWCLM |
Index of Claims | 1 | View | |
| 2003-08-18 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2003-08-18 | SPEC |
Specification | 2 | View | |
| 2003-08-18 | CLM |
Claims | 9 | View | |
| 2003-08-18 | DRW |
Drawings-only black and white line drawings | 1 | View | |
| 2003-08-18 | REM |
Applicant Arguments/Remarks Made in an Amendment | 7 | View | |
| 2003-08-18 | DRW |
Drawings-only black and white line drawings | 1 | View | |
| 2003-08-18 | XT/ |
Extension of Time | 1 | View | |
| 2003-04-17 | CTNF |
Non-Final Rejection | 12 | View | |
| 2003-04-17 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-04-17 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2001-11-26 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 2 | View | |
| 2001-11-26 | FOR |
Foreign Reference | 22 | View | |
| 2001-11-26 | FOR |
Foreign Reference | 7 | View | |
| 2001-11-26 | FOR |
Foreign Reference | 5 | View | |
| 2001-11-26 | FOR |
Foreign Reference | 11 | View | |
| 2001-11-26 | FOR |
Foreign Reference | 9 | View | |
| 2001-11-26 | FOR |
Foreign Reference | 13 | View | |
| 2001-11-26 | FOR |
Foreign Reference | 21 | View | |
| 2001-11-26 | FOR |
Foreign Reference | 26 | View | |
| 2001-07-03 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2001-07-03 | REM |
Applicant Arguments/Remarks Made in an Amendment | 2 | View | |
| 2001-07-03 | SPEC |
Specification | 63 | View | |
| 2001-07-03 | REM |
Applicant Arguments/Remarks Made in an Amendment | 51 | View | |
| 2001-04-03 | LET. |
Miscellaneous Incoming Letter | 4 | View | |
| 2001-04-03 | OATH |
Oath or Declaration filed | 4 | View | |
| 2001-04-03 | DRW |
Drawings-only black and white line drawings | 27 | View | |
| 2001-04-03 | FRPR |
Certified Copy of Foreign Priority Application | 64 | View | |
| 2001-03-02 | CTMS |
Miscellaneous Action with shortened statutory period (SSP) | 1 | View | |
| 2001-01-17 | TRNA |
Transmittal of New Application | 3 | View | |
| 2001-01-17 | SPEC |
Specification | 50 | View | |
| 2001-01-17 | CLM |
Claims | 6 | View | |
| 2001-01-17 | ABST |
Abstract | 1 | View | |
| 2001-01-17 | DRW |
Drawings-only black and white line drawings | 27 | View | |
| 2001-01-17 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2001-01-17 | TRNA |
Transmittal of New Application | 3 | View | |
| 2001-01-17 | DRW |
Drawings-only black and white line drawings | 27 | View | |
| 2001-01-17 | SPEC |
Specification | 50 | View | |
| 2001-01-17 | CLM |
Claims | 6 | View | |
| 2001-01-17 | ABST |
Abstract | 1 | View | |
| 2001-01-17 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2001-01-17 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2001-01-17 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2001-01-17 | FWCLM |
Index of Claims | 1 | View |
Inventors
Hiroyuki Nakano
Yokohama, JAPAN
Toshihiko Nakata
Hiratsuka, JAPAN
Masayoshi Serizawa
Fujisawa, JAPAN
Attorneys & Agents of Record
Classification
USPC
356/336
H01J37/32082
H01J37/32935
H01J2237/0225
Prosecution
- Examiner
- SEVER, ANDREW T
- Art Unit
- 2851
- Customer No.
- 20457
- Docket No.
- 501.39474X00
- Confirmation No.
- 5851
Foreign Priority
00-010271
·
2000-01-17
·
JAPAN
Publication
- Pub. No.
- US20010016430A1
- Pub. Date
- 2001-08-23
Patent Term Adjustment
-63days
from
HITACHI, LTD.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-09-26
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-04-03
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Quick Facts
- App. No.
- 09/760,704
- Filed
- 2001-01-17
- Granted
- 2004-08-17
- Pub. No.
- US20010016430A1
- Examiner
- SEVER, ANDREW T
- Art Unit
- 2851
- PTA
- -63 days
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