Granted Patent
Utility
US 6,646,729
· Confirmation No. 6207
METHOD OF MEASURING ABERRATION IN AN OPTICAL IMAGING SYSTEM
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2003-09-05 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2001-02-21 | TRNA |
Transmittal of New Application | 2 | View | |
| 2001-02-21 | A.PE |
Preliminary Amendment | 8 | View | |
| 2001-02-21 | SPEC |
Specification | 23 | View | |
| 2001-02-21 | CLM |
Claims | 4 | View | |
| 2001-02-21 | ABST |
Abstract | 1 | View | |
| 2001-02-21 | DRW |
Drawings-only black and white line drawings | 7 | View | |
| 2001-02-21 | OATH |
Oath or Declaration filed | 2 | View | |
| 2001-02-21 | DRW |
Drawings-only black and white line drawings | 1 | View | |
| 2001-02-21 | TRNA |
Transmittal of New Application | 2 | View | |
| 2001-02-21 | A.PE |
Preliminary Amendment | 8 | View | |
| 2001-02-21 | SPEC |
Specification | 23 | View | |
| 2001-02-21 | CLM |
Claims | 4 | View | |
| 2001-02-21 | ABST |
Abstract | 1 | View | |
| 2001-02-21 | DRW |
Drawings-only black and white line drawings | 7 | View | |
| 2001-02-21 | OATH |
Oath or Declaration filed | 2 | View | |
| 2001-02-21 | DRW |
Drawings-only black and white line drawings | 1 | View |
Inventors
Hans Van der Laan
Veldhoven, NETHERLANDS
Marco H. Moers
Eindhoven, NETHERLANDS
Attorneys & Agents of Record
Classification
USPC
356/124
G01M11/02
G03F7/706
Prosecution
- Examiner
- STAFIRA, MICHAEL PATRICK
- Art Unit
- 2877
- Customer No.
- 909
- Docket No.
- PM 0277094
- Confirmation No.
- 6207
Foreign Priority
00301420.6
·
2000-02-23
·
EUROPEAN PATENT OFFICE (EPO)
Publication
- Pub. No.
- US20020008869A1
- Pub. Date
- 2002-01-24
Patent Term Adjustment
-30days
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-02-21
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Quick Facts
- Patent No.
- US 6,646,729
- App. No.
- 09/788,478
- Filed
- 2001-02-21
- Granted
- 2003-11-11
- Pub. No.
- US20020008869A1
- Examiner
- STAFIRA, MICHAEL PATRICK
- Art Unit
- 2877
- PTA
- -30 days
External Links