Patent Application
Utility
App. No. 09/883,373
· Confirmation No. 1068
Method of manufacturing semiconductor device having a plurality of gate insulating films of different thicknesses, and method of manufacturing such semiconductor device
Inventor:
Eiji Hasegawa
Abandoned -- Failure to Respond to an Office Action
View Publication ↗
|
⬇ PDF
|
Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-01-06 | ABN |
Abandonment | 3 | View | |
| 2003-09-25 | CTAV |
Advisory Action (PTOL-303) | 4 | View | |
| 2003-09-25 | FWCLM |
Index of Claims | 1 | View | |
| 2003-07-25 | A.NE |
Response After Final Action | 1 | View | |
| 2003-07-25 | REM |
Applicant Arguments/Remarks Made in an Amendment | 6 | View | |
| 2003-05-08 | CTFR |
Final Rejection | 7 | View | |
| 2003-05-08 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-04-22 | SRNT |
Examiner's search strategy and results | 1 | View | |
| 2003-04-18 | SRNT |
Examiner's search strategy and results | 2 | View | |
| 2003-02-04 | LET. |
Miscellaneous Incoming Letter | 1 | View | |
| 2003-02-04 | DRW |
Drawings-only black and white line drawings | 2 | View | |
| 2003-02-04 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2003-02-04 | CLM |
Claims | 3 | View | |
| 2003-02-04 | REM |
Applicant Arguments/Remarks Made in an Amendment | 7 | View | |
| 2002-11-20 | CTNF |
Non-Final Rejection | 6 | View | |
| 2002-11-20 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2002-11-20 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2002-11-20 | 892 |
List of references cited by examiner | 1 | View | |
| 2002-11-18 | SRNT |
Examiner's search strategy and results | 1 | View | |
| 2002-09-05 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2002-09-05 | REM |
Applicant Arguments/Remarks Made in an Amendment | 1 | View | |
| 2002-08-13 | CTNF |
Non-Final Rejection | 4 | View | |
| 2002-06-03 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 2 | View | |
| 2002-06-03 | FOR |
Foreign Reference | 14 | View | |
| 2001-06-19 | TRNA |
Transmittal of New Application | 2 | View | |
| 2001-06-19 | ADS |
Application Data Sheet | 1 | View | |
| 2001-06-19 | SPEC |
Specification | 32 | View | |
| 2001-06-19 | CLM |
Claims | 5 | View | |
| 2001-06-19 | ABST |
Abstract | 1 | View | |
| 2001-06-19 | DRW |
Drawings-only black and white line drawings | 10 | View | |
| 2001-06-19 | OATH |
Oath or Declaration filed | 2 | View | |
| 2001-06-19 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2001-06-19 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2001-06-19 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2001-06-19 | WCLM |
Claims Worksheet (PTO-2022) | 1 | View | |
| 2001-06-19 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2001-06-19 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2001-06-19 | FWCLM |
Index of Claims | 1 | View | |
| 2001-06-19 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 1 | View | |
| 2001-06-19 | FOR |
Foreign Reference | 9 | View | |
| 2001-06-19 | FOR |
Foreign Reference | 8 | View | |
| 2001-06-19 | FOR |
Foreign Reference | 10 | View | |
| 2001-06-19 | FRPR |
Certified Copy of Foreign Priority Application | 34 | View | |
| 2001-06-19 | TRNA |
Transmittal of New Application | 2 | View | |
| 2001-06-19 | ADS |
Application Data Sheet | 1 | View | |
| 2001-06-19 | SPEC |
Specification | 32 | View | |
| 2001-06-19 | CLM |
Claims | 5 | View | |
| 2001-06-19 | ABST |
Abstract | 1 | View | |
| 2001-06-19 | DRW |
Drawings-only black and white line drawings | 10 | View | |
| 2001-06-19 | OATH |
Oath or Declaration filed | 2 | View |
Inventors
Eiji Hasegawa
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
438/193
H10D64/01344
H10D84/0165
H10D64/685
H10D84/0144
H10D84/038
H10D64/693
H10D64/01336
Prosecution
- Examiner
- BEREZNY, NEAL
- Art Unit
- 2823
- Customer No.
- 466
- Docket No.
- NEC01P075-AMb
- Confirmation No.
- 1068
Foreign Priority
2000-185283
·
2000-06-20
·
JAPAN
Publication
- Pub. No.
- US20010052618A1
- Pub. Date
- 2001-12-20
No related applications found.
from
NEC CORPORATION
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-05-01
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this application's details
Quick Facts
- App. No.
- 09/883,373
- Filed
- 2001-06-19
- Pub. No.
- US20010052618A1
- Examiner
- BEREZNY, NEAL
- Art Unit
- 2823
External Links