Patent Application
Utility
App. No. 09/906,060
· Confirmation No. 6324
SEMICONDUCTOR WAFER, SEMICONDUCTOR CHIP, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-01-15 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2003-10-16 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 4 | View | |
| 2003-10-16 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 1 | View | |
| 2003-10-16 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2003-10-16 | FWCLM |
Index of Claims | 1 | View | |
| 2003-10-16 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2003-08-13 | LET. |
Miscellaneous Incoming Letter | 2 | View | |
| 2003-08-06 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2003-08-06 | CLM |
Claims | 7 | View | |
| 2003-08-06 | REM |
Applicant Arguments/Remarks Made in an Amendment | 5 | View | |
| 2003-08-06 | XT/ |
Extension of Time | 1 | View | |
| 2003-03-19 | EXIN |
Examiner Interview Summary Record (PTOL - 413) | 3 | View | |
| 2003-03-06 | CTNF |
Non-Final Rejection | 5 | View | |
| 2003-03-06 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-02-12 | SA.. |
Supplemental Response or Supplemental Amendment | 1 | View | |
| 2003-02-12 | CLM |
Claims | 2 | View | |
| 2003-02-12 | ABST |
Abstract | 1 | View | |
| 2003-02-12 | REM |
Applicant Arguments/Remarks Made in an Amendment | 5 | View | |
| 2003-02-12 | SPEC |
Specification | 34 | View | |
| 2003-01-06 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2003-01-06 | CLM |
Claims | 6 | View | |
| 2003-01-06 | REM |
Applicant Arguments/Remarks Made in an Amendment | 45 | View | |
| 2003-01-06 | XT/ |
Extension of Time | 1 | View | |
| 2002-08-06 | CTNF |
Non-Final Rejection | 6 | View | |
| 2002-08-06 | 892 |
List of references cited by examiner | 1 | View | |
| 2001-07-17 | TRNA |
Transmittal of New Application | 3 | View | |
| 2001-07-17 | SPEC |
Specification | 39 | View | |
| 2001-07-17 | CLM |
Claims | 4 | View | |
| 2001-07-17 | ABST |
Abstract | 1 | View | |
| 2001-07-17 | DRW |
Drawings-only black and white line drawings | 20 | View | |
| 2001-07-17 | OATH |
Oath or Declaration filed | 4 | View | |
| 2001-07-17 | TRNA |
Transmittal of New Application | 3 | View | |
| 2001-07-17 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2001-07-17 | SPEC |
Specification | 39 | View | |
| 2001-07-17 | CLM |
Claims | 4 | View | |
| 2001-07-17 | ABST |
Abstract | 1 | View | |
| 2001-07-17 | OATH |
Oath or Declaration filed | 4 | View | |
| 2001-07-17 | DRW |
Drawings-only black and white line drawings | 20 | View | |
| 2001-07-17 | WFEE |
Fee Worksheet (SB06) | 2 | View | |
| 2001-07-17 | WCLM |
Claims Worksheet (PTO-2022) | 1 | View | |
| 2001-07-17 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2001-07-17 | FWCLM |
Index of Claims | 1 | View | |
| 2001-07-17 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2001-07-17 | FRPR |
Certified Copy of Foreign Priority Application | 59 | View |
Inventors
Attorneys & Agents of Record
Classification
USPC
365/201
Prosecution
- Examiner
- NGUYEN, TAN
- Art Unit
- 2818
- Customer No.
- 20457
- Docket No.
- 843.40341X00
- Confirmation No.
- 6324
Foreign Priority
2000-218234
·
2000-07-19
·
JAPAN
Publication
- Pub. No.
- US20020009006A1
- Pub. Date
- 2002-01-24
Patent Term Adjustment
-159days
MERGER AND CHANGE OF NAME
Recorded 2010-09-09
from
HITACHI, LTD.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-09-26
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-07-07
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Quick Facts
- App. No.
- 09/906,060
- Filed
- 2001-07-17
- Granted
- 2004-03-23
- Pub. No.
- US20020009006A1
- Examiner
- NGUYEN, TAN
- Art Unit
- 2818
- PTA
- -159 days
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