IP Library › Granted Patent US 6,490,198
Granted Patent Utility
US 6,490,198 · Confirmation No. 8876

TEST METHODS FOR SEMICONDUCTOR NON-VOLATILE MEMORIES

Inventor: Satoshi Yoshimura
Patented Case View Patent ↗ View Publication ↗
⬇ PDF
 Code Description Pages PDF
2001-08-07 TRNA Transmittal of New Application 2 View
2001-08-07 ADS Application Data Sheet 2 View
2001-08-07 SPEC Specification 23 View
2001-08-07 CLM Claims 2 View
2001-08-07 ABST Abstract 1 View
2001-08-07 DRW Drawings-only black and white line drawings 11 View
2001-08-07 OATH Oath or Declaration filed 3 View
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Quick Facts
Patent No.
US 6,490,198
App. No.
09/922,791
Filed
2001-08-07
Granted
2002-12-03
Pub. No.
US20020018365A1
Examiner
PHUNG, ANH K
Art Unit
2824
PTA
-83 days