IP Library › Assignment 012060/0308
Patent Assignment
Reel/Frame 012060/0308

Assignment of Assignor's Interest

Recorded: 2001-08-07 Pages: 3
Assignor
YOSHIMURA, SATOSHI
Executed: 2001-07-10
Assignee
SHARP KABUSHIKI KAISHA
22-22, NAGAIKE-CHO, ABENO-KU, OSAKA 545-0013, JAPAN
Covered Property (1)
Test Methods for Semiconductor Non-Volatile Memories
Patent: 6,490,198 →
Application: 09/922,791 →
Publication: US 2002/0018365
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 15, 2011
From: SHARP KABUSHIKI KAISHA
To: INTELLECTUAL PROPERTIES I KFT.
Reel/Frame 027387/0650 →
Assignment of Assignor's Interest Mar 2, 2015
From: INTELLECTUAL PROPERTIES I KFT.
To: SAMSUNG ELECTRONICS CO., LTD
Reel/Frame 035120/0878 →
Corrective Assignment to Correct the Assignee Name Previously Recorded at Reel: 035120 Frame: 0878. Assignor(S) Hereby Confirms the Assignment. Jun 5, 2015
From: INTELLECTUAL PROPERTIES I KFT.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 035837/0619 →