IP Library Patent Application 10002575
Patent Application Utility
App. No. 10/002,575 · Confirmation No. 4237

SYSTEM FOR IN-SITU MONITORING OF REMOVAL RATE/THICKNESS OF TOP LAYER DURING PLANARIZATION

Inventor: Sundar Amartur
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗
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Code Description Pages PDF
2003-10-14 IFEE Issue Fee Payment (PTO-85B) 1 View
2002-03-05 TRNA Transmittal of New Application 3 View
2002-03-05 DRW Drawings-only black and white line drawings 10 View
2001-11-14 TRNA Transmittal of New Application 3 View
2001-11-14 SPEC Specification 22 View
2001-11-14 CLM Claims 5 View
2001-11-14 ABST Abstract 1 View
2001-11-14 DRW Drawings-only black and white line drawings 10 View
2001-11-14 OATH Oath or Declaration filed 2 View
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Quick Facts
App. No.
10/002,575
Filed
2001-11-14
Granted
2003-12-30
Art Unit
3723
PTA
-9 days