IP Library Granted Patent US 6,624,653
Granted Patent Utility
US 6,624,653 · Confirmation No. 8462

METHOD AND SYSTEM FOR WAFER LEVEL TESTING AND BURNING-IN SEMICONDUCTOR COMPONENTS

Inventor: Daniel P. Cram
Patented Case View Patent ↗
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Code Description Pages PDF
2003-07-03 IFEE Issue Fee Payment (PTO-85B) 1 View
2003-07-03 LET. Miscellaneous Incoming Letter 1 View
2002-01-07 TRNA Transmittal of New Application 3 View
2002-01-07 A.PE Preliminary Amendment 10 View
2002-01-07 SPEC Specification 19 View
2002-01-07 CLM Claims 13 View
2002-01-07 ABST Abstract 1 View
2002-01-07 DRW Drawings-only black and white line drawings 8 View
2002-01-07 OATH Oath or Declaration filed 2 View
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Quick Facts
Patent No.
US 6,624,653
App. No.
10/037,562
Filed
2002-01-07
Granted
2003-09-23
Art Unit
2829
PTA
0 days