IP Library Patent Application 10120734
Patent Application Utility Small
App. No. 10/120,734 · Confirmation No. 1938

APPARATUS AND METHOD FOR DETERMINING DOPING CONCENTRATION OF A SEMICONDUCTOR WAFER

Inventor: William H. Howland
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗
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2006-10-18 FRPR Certified Copy of Foreign Priority Application 56 View
2003-09-17 LET. Miscellaneous Incoming Letter 2 View
2003-07-15 IFEE Issue Fee Payment (PTO-85B) 1 View
2003-07-15 LET. Miscellaneous Incoming Letter 1 View
2003-07-15 DRW Drawings-only black and white line drawings 4 View
2002-04-11 TRNA Transmittal of New Application 4 View
2002-04-11 SPEC Specification 10 View
2002-04-11 CLM Claims 3 View
2002-04-11 ABST Abstract 1 View
2002-04-11 DRW Drawings-only black and white line drawings 4 View
2002-04-11 OATH Oath or Declaration filed 2 View
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Quick Facts
App. No.
10/120,734
Filed
2002-04-11
Granted
2003-10-14
Art Unit
2814
PTA
-1 days