Granted Patent
Utility
US 6,720,196
· Confirmation No. 2742
NITRIDE-BASED SEMICONDUCTOR ELEMENT AND METHOD OF FORMING NITRIDE-BASED SEMICONDUCTOR
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-02-12 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2003-11-14 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 4 | View | |
| 2003-11-14 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2003-11-14 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2003-11-14 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2003-11-14 | FWCLM |
Index of Claims | 1 | View | |
| 2003-10-28 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2003-10-28 | FWCLM |
Index of Claims | 1 | View | |
| 2003-10-03 | XT/ |
Extension of Time | 1 | View | |
| 2003-10-02 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 2 | View | |
| 2003-10-02 | SPEC |
Specification | 1 | View | |
| 2003-10-02 | ABST |
Abstract | 1 | View | |
| 2003-10-02 | CLM |
Claims | 9 | View | |
| 2003-10-02 | REM |
Applicant Arguments/Remarks Made in an Amendment | 6 | View | |
| 2003-05-16 | CTNF |
Non-Final Rejection | 10 | View | |
| 2003-05-16 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-05-16 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2003-05-09 | SRNT |
Examiner's search strategy and results | 3 | View | |
| 2003-05-02 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 2 | View | |
| 2003-04-03 | CTRS |
Requirement for Restriction/Election | 4 | View | |
| 2002-05-06 | TRNA |
Transmittal of New Application | 2 | View | |
| 2002-05-06 | SPEC |
Specification | 45 | View | |
| 2002-05-06 | CLM |
Claims | 10 | View | |
| 2002-05-06 | ABST |
Abstract | 1 | View | |
| 2002-05-06 | DRW |
Drawings-only black and white line drawings | 11 | View | |
| 2002-05-06 | OATH |
Oath or Declaration filed | 3 | View | |
| 2002-05-06 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2002-05-06 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2002-05-06 | FWCLM |
Index of Claims | 1 | View | |
| 2002-05-06 | DRW |
Drawings-only black and white line drawings | 11 | View | |
| 2002-05-06 | TRNA |
Transmittal of New Application | 2 | View | |
| 2002-05-06 | SPEC |
Specification | 45 | View | |
| 2002-05-06 | CLM |
Claims | 10 | View | |
| 2002-05-06 | ABST |
Abstract | 1 | View | |
| 2002-05-06 | OATH |
Oath or Declaration filed | 3 | View | |
| 2002-05-06 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-05-06 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-05-06 | WCLM |
Claims Worksheet (PTO-2022) | 1 | View | |
| 2002-05-06 | FRPR |
Certified Copy of Foreign Priority Application | 45 | View | |
| 2002-05-06 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 2 | View |
Inventors
Tatsuya Kunisato
Osaka, JAPAN
Yasuhiko Nomura
Osaka, JAPAN
Takashi Kano
Osaka, JAPAN
Hiroki Ohbo
Osaka, JAPAN
Masayuki Hata
Osaka, JAPAN
Attorneys & Agents of Record
Classification
USPC
438/22
H10P14/3216
H10P14/271
H10P14/2921
H10P14/2901
H10P14/3251
H10P14/24
H10P14/276
H10P14/3416
B82Y10/00
B82Y20/00
Prosecution
- Examiner
- HUYNH, ANDY
- Art Unit
- 2818
- Docket No.
- 57810-042
- Confirmation No.
- 2742
Foreign Priority
JP2001-140825
·
2001-05-11
·
JAPAN
Publication
- Pub. No.
- US20020167028A1
- Pub. Date
- 2002-11-14
Patent Term Adjustment
-47days
No related applications found.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2017-03-20
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2016-11-01
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2012-03-30
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2002-05-06
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Quick Facts
- Patent No.
- US 6,720,196
- App. No.
- 10/138,420
- Filed
- 2002-05-06
- Granted
- 2004-04-13
- Pub. No.
- US20020167028A1
- Examiner
- HUYNH, ANDY
- Art Unit
- 2818
- PTA
- -47 days
External Links