Patent Application
Utility
App. No. 10/152,689
· Confirmation No. 7450
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE PROVIDED WITH A SELF-TESTING CIRCUIT FOR CARRYING OUT AN ANALYSIS FOR REPAIR BY USING A REDUNDANT MEMORY CELL
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2003-07-10 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2002-05-23 | TRNA |
Transmittal of New Application | 2 | View | |
| 2002-05-23 | SPEC |
Specification | 61 | View | |
| 2002-05-23 | CLM |
Claims | 7 | View | |
| 2002-05-23 | ABST |
Abstract | 1 | View | |
| 2002-05-23 | DRW |
Drawings-only black and white line drawings | 30 | View | |
| 2002-05-23 | OATH |
Oath or Declaration filed | 3 | View |
Inventors
Jun Ohtani
Hyogo, JAPAN
Tomoya Kawagoe
Hyogo, JAPAN
Attorneys & Agents of Record
Classification
USPC
365/200
G11C29/72
G11C11/401
G11C29/12
G11C29/4401
Prosecution
- Examiner
- TRAN, MICHAEL THANH
- Art Unit
- 2818
- Docket No.
- 57454-571
- Confirmation No.
- 7450
Foreign Priority
2001-191113 (P)
·
2001-06-25
·
JAPAN
Publication
- Pub. No.
- US20020196683A1
- Pub. Date
- 2002-12-26
Patent Term Adjustment
0days
No related applications found.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2011-03-18
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2002-05-23
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Quick Facts
- App. No.
- 10/152,689
- Filed
- 2002-05-23
- Granted
- 2003-09-23
- Pub. No.
- US20020196683A1
- Examiner
- TRAN, MICHAEL THANH
- Art Unit
- 2818
- PTA
- 0 days
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