Patent Assignment
Reel/Frame 012934/0521
Assignment of Assignor's Interest
Recorded: 2002-05-23
Pages: 2
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
CHIYODA-KU, 2-3, MARUNOUCHI 2-CHOME, TOKYO 100-8310, JAPAN
Covered Property
(1)
Semiconductor Integrated Circuit Device Provided with a Self-Testing Circuit for Carrying Out an Analysis for Repair by Using a Redundant Memory Cell
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.