Method and device to clean probes
View Patent ↗A probe cleaning system automatically detects a surface of a probe cleaning device during a cleaning process by providing a predetermined finish on the surface of the probe cleaning device. The predetermined finish can include a textured or machined finish or a marking, such that the predetermined finish provides contrast against the surface. Cameras in the system automatically focus on the surface, with the predetermined finish. This in-focus condition is related to a distance between probes and the surface. Once an in-focus condition is determined, the system performs an automated cleaning process by interacting the probes with the probe cleaning device.
1. A probe cleaning device, comprising:
a substrate layer; and
a continuous gel layer coupled to said substrate layer, said gel layer having a surface with a predetermined finish comprising a discontinuity on said surface sufficiently distinct for a camera to automatically focus on said surface during a cleaning process.
2. The probe cleaning device of claim 1 , wherein said predetermined finish comprises a textured finish and said textured finish comprises said discontinuity.
3. The probe cleaning device of claim 2 , wherein said textured finish comprises a periodic pattern in which said discontinuity is repeated on said surface.
4. The probe cleaning device of claim 1 , wherein said discontinuity is disposed in a predetermined section of said surface that is not contacted by probes during said cleaning process.
5. The probe cleaning device of claim 4 , wherein the predetermined section is a peripheral section.
6. The probe cleaning device of claim 1 , wherein said surface has said predetermined finish prior to use of said gel layer to clean probes.
7. The probe cleaning device of claim 1 , wherein said gel comprises a cleaning gel.
8. The probe cleaning device of claim 1 further comprising an abrasive layer positioned between said substrate layer and said gel layer.
9. A probe cleaning device, comprising:
a substrate layer; and
a continuous gel layer coupled to said substrate layer, said gel layer having a surface with a marking on said surface, said marking being sufficiently distinct for a camera to automatically focus on said surface during a cleaning process,
wherein said marking is in a predetermined section of said surface that is not contacted by probes during said cleaning process.
10. The probe cleaning device of claim 9 , further comprising an abrasive layer positioned between the substrate layer and said gel layer.
11. The probe cleaning device of claim 9 , wherein said marking has at least one of a color or shape that provides a contrast with a remaining portion of said surface.
12. The probe cleaning device of claim 9 , wherein said predetermined section is a peripheral section of said surface.
13. The probe cleaning device of claim 9 , wherein said marking is less than 5 μm RMS.
14. The probe cleaning device of claim 9 , wherein said surface has said marking prior to use of said gel layer to clean probes.
15. The probe cleaning device of claim 9 , wherein said gel comprises a cleaning gel.
16. A probe cleaning device, comprising:
a substrate layer; and
a continuous gel layer coupled to said substrate layer, said gel layer having a surface with a discontinuity disposed on an unbroken portion of said surface, said discontinuity being sufficiently distinct for a camera to automatically focus on said surface during a cleaning process.
17. The probe cleaning device of claim 16 , wherein said surface comprises a textured surface portion, said textured surface portion comprising said discontinuity.
18. The probe cleaning device of claim 16 , wherein the probe cleaning device cleans probes when the gel layer is brought into contact with the probes during a cleaning process.
19. The probe cleaning device of claim 16 , wherein the substrate layer and the gel layer together comprise a wafer.
20. The probe cleaning device of claim 16 , wherein said surface has said discontinuity prior to use of said gel layer to clean probes.
21. The probe cleaning device of claim 17 , wherein said textured surface portion comprises a periodic pattern in which said discontinuity is repeated on said surface.
22. The probe cleaning device of claim 16 , wherein said discontinuity is disposed in a predetermined section of said surface that is not contacted by probes during said cleaning process.
23. The probe cleaning device of claim 22 , wherein the predetermined section is a peripheral section.
24. The probe cleaning device of claim 16 , wherein:
said discontinuity comprises one or more contours on said surface that correspond to contours of a mold in which said surface was formed, and
another surface of said gel layer is attached to said substrate layer, said another surface is opposite said surface on which said contours are located.
25. The probe cleaning device of claim 16 , wherein said gel comprises a cleaning gel.
26. The probe cleaning device of claim 16 further comprising an abrasive layer positioned between said substrate layer and said gel layer.