IP Library Patent Application 10187526
Patent Application Utility
App. No. 10/187,526 · Confirmation No. 7678

ENHANCED PROBE FOR GATHERING DATA FROM SEMICONDUCTOR DEVICES

Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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Code Description Pages PDF
2004-01-26 IFEE Issue Fee Payment (PTO-85B) 1 View
2002-07-02 TRNA Transmittal of New Application 2 View
2002-07-02 A.PE Preliminary Amendment 1 View
2002-07-02 SPEC Specification 14 View
2002-07-02 CLM Claims 5 View
2002-07-02 ABST Abstract 1 View
2002-07-02 DRW Drawings-only black and white line drawings 3 View
2002-07-02 OATH Oath or Declaration filed 2 View
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Quick Facts
App. No.
10/187,526
Filed
2002-07-02
Granted
2004-03-09
Pub. No.
US20020167008A1
Art Unit
2813
PTA
0 days