IP Library Granted Patent US 6,907,150
Granted Patent B2
US 6,907,150 · App. 10/199,476 · Granted Jun 14, 2005

Etching process for micromachining crystalline materials and devices fabricated thereby

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Quick Facts
Patent No.
US 6,907,150
App. No.
10/199,476
Granted
Jun 14, 2005
Kind
B2
Abstract

The present invention provides an optical microbench having intersecting structures etched into a substrate. In particular, microbenches in accordance with the present invention include structures having a planar surfaces formed along selected crystallographic planes of a single crystal substrate. Two of the structures provided are an etch-stop pit and an anisotropically etched feature disposed adjacent the etch-stop pit. At the point of intersection between the etch-stop pit and the anisotropically etched feature the orientation of the crystallographic planes is maintained. The present invention also provides a method for micromachining a substrate to form an optical microbench. The method comprises the steps of forming an etch-stop pit and forming an anisotropically etched feature adjacent the etch-stop pit. The method may also comprise coating the surfaces of the etch-stop pit with an etch-stop layer.

Claims (44)

1. A method for micromachining crystalline substrate, comprising:

providing a crystalline substrate;

directionally etching an etch-stop pit into the substrate;

conformally coating the etch-stop pit with a mask material resistant to a selected anisotropic wet etchant for the substrate; and

anisotropically wet etching an area adjacent to the etch-stop pit with the selected etchant to provide an anisotropic feature in the substrate surface.

2. The method according to claim 1 , wherein the wet etched area abuts a selected portion of the mask.

3. The method according to claim 1 , wherein the etch-stop pit extends into the anisotropic feature.

4. The method according to claim 1 , wherein the anisotropic feature comprises a groove and wherein the etch-stop pit comprises a first sidewall portion that intersects the groove end at a non-orthogonal angle relative to a longitudinal axis of the groove so that at least a portion of a wedge-shaped end portion of the groove is absent.

5. The method according to claim 1 , wherein at least a portion of the anisotropic feature is disposed externally to the etch-stop pit.

6. The method according to claim 1 , wherein at least a portion of the etch-stop pit is disposed externally to the anisotropic feature.

7. The method according to claim 1 , wherein the substrate comprises an upper surface and wherein the etch-stop pit extends into the substrate from the upper surface.

8. The method according to claim 1 , wherein the substrate comprises an upper surface and wherein the anisotropic feature extends into the substrate from the upper surface.

9. The method according to claim 1 , wherein the directional etching comprises at least one of plasma etching, reactive ion etching, or ion milling.

10. The method according to claim 1 , wherein the wet etching comprises etching with at least one of TMAH, KOH, or EDP.

11. The method according to claim 1 , wherein the substrate comprises single crystal silicon.

12. The method according to claim 1 , wherein the mask material comprises at least one of an oxide and a nitride of the substrate material.

13. The method according to claim 1 , wherein the conformal coating comprises thermally oxidizing the surfaces of the etch-stop pit.

14. The method according to claim 1 , comprising removing the mask material.

15. A micromachined crystalline substrate comprising:

a first anisotropically etched groove disposed in a substrate, the groove comprising an end; and

a directionally-etched etch-stop pit comprising a first sidewall portion that intersects the groove end at a non-orthogonal angle relative to a longitudinal axis of the groove so that at least a portion of a wedge-shaped end portion of the groove is absent.

16. The micromachined crystalline substrate according to claim 15 , wherein the first sidewall portion intersects the groove end at a non-orthogonal angle relative to a longitudinal axis of the groove so that a wedge-shaped end portion of the groove is absent.

17. The micromachined crystalline substrate according to claim 15 , wherein the etch-stop pit extends into the groove.

18. The micromachined crystalline substrate according to claim 15 , wherein the etch-stop pit comprises a vertical sidewall.

19. The micromachined crystalline substrate according to claim 15 , wherein at least a portion of the anisotropic feature is disposed externally to the etch-stop pit.

20. The micromachined crystalline substrate according to claim 15 , wherein at least a portion of the etch-stop pit is disposed externally to the anisotropic feature.

21. The micromachined crystalline substrate according to claim 15 , wherein the substrate comprises an upper surface and wherein the etch-stop pit extends into the substrate from the upper surface.

22. The micromachined crystalline substrate according to claim 15 , wherein the substrate comprises an upper surface and wherein the anisotropic feature extends into the substrate from the upper surface.

23. The micromachined crystalline substrate according to claim 15 , wherein the etch-stop pit comprises a triangular cross-sectional shape.

24. The micromachined crystalline substrate according to claim 15 , comprising a fiber disposed in the groove and the etch-stop pit.

25. The micromachined crystalline substrate according to claim 15 , wherein the substrate comprises single crystal silicon.

26. The micromachined crystalline substrate according to claim 15 , wherein the groove comprises a V-groove.

27. The micromachined crystalline substrate according to claim 15 , comprising a second anisotropically etched groove disposed in the substrate, wherein the etch-stop pit is disposed between the first groove and second groove, and wherein the etch-stop pit comprises a second sidewall portion that intersects the second groove end at a non-orthogonal angle relative to a longitudinal axis of the second groove so that at least a portion of a wedge-shaped end portion of the second groove is absent.

28. A micromachined crystalline substrate comprising:

a first anisotropically etched groove disposed in a substrate;

a second anisotropically etched groove in the substrate that intersects the first groove to provide a convex coiner location; and

a directionally-etched etch-stop pit disposed at the convex corner location.

29. A micromachined crystalline substrate comprising an anisotropically etched pit in the substrate, and an etch-stop pit comprising a U-shaped portion, the etch-stop pit intersecting the wet pit.

30. The micromachined crystalline substrate of claim 28 , wherein the etch-stop pit comprises an unetched region interior to the U-shaped portion.

31. A micromachined crystalline substrate comprising:

an anisotropically etched groove disposed in a substrate;

a directionally-etched etch-stop pit disposed within the groove; and

a wedge-shaped protrusion disposed within the groove and adjacent to the etch-stop pit.

32. A micromachined crystalline substrate comprising an anisotropically etched pit and an etch-stop pit circumscribing the anisotropically etched pit.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 23, 2011
From: IP CUBE PARTNERS CO. LTD.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 026323/0651 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 14, 2011
From: NUVOTRONICS, LLC
To: IP CUBE PARTNERS CO. LTD.
Reel/Frame 025950/0522 →