Lithographic template having a repaired gap defect method of repair and use
View Patent ↗This invention relates to semiconductor devices, microelectronic devices, micro electro mechanical devices, microfluidic devices, and more particularly to an improved lithographic template including a repaired defect, a method of fabricating the improved lithographic template, a method for repairing defects present in the template, and a method for making semiconductor devices with the improved lithographic template. The lithographic template ( 10 ) is formed having a relief structure ( 26 ) and a repaired gap defect ( 36 ) within the relief structure ( 26 ). The template ( 10 ) is used in the fabrication of a semiconductor device ( 40 ) for affecting a pattern in device ( 40 ) by positioning the template ( 10 ) in close proximity to semiconductor device ( 40 ) having a radiation sensitive material formed thereon and applying a pressure to cause the radiation sensitive material to flow into the relief structure present on the template. Radiation is then applied through the template so as to further cure portions of the radiation sensitive material and further define the pattern in the radiation sensitive material. The template ( 10 ) is then removed to complete fabrication of semiconductor device ( 40 ).
1. A method of forming a lithographic template comprising the steps of:
providing a lithographic template having an uppermost surface and having formed therein the uppermost surface a relief structure and at least one gap defect in the relief structure;
providing a directly imageable oxide material on the relief structure of the lithographic template and within the gap defect;
imaging the directly imageable oxide material, thereby forming a layer of imaged oxide within the gap defect; and
removing any excess directly imageable oxide material from the relief structure of the lithographic template, wherein at least part of the imaged oxide layer remains in the gap defect after it has been repaired.
2. A method of forming a lithographic template as claimed in claim 1 further including the step of trimming back excess imaged oxide extraneous to the gap defect, thereby resulting in a complete lithographic template having a repaired gap defect.
3. A method of forming a lithographic template as claimed in claim 2 , wherein the step of providing a lithographic template is further characterized as providing a substrate material comprised of one of a quartz material, a polycarbonate material, a calcium fluoride (CaF2) material, a magnesium fluoride (MgF2) material, or a pyrex material.
4. A method of forming a lithographic template as claimed in claim 3 wherein the lithographic template is formed of a single homogeneous substrate material having the relief structure formed therein an uppermost surface of the substrate material.
5. A method of forming a lithographic template as claimed in claim 2 wherein the lithographic template is comprised of a plurality of layers having the relief structure formed therein an uppermost surface of an uppermost layer.
6. A method of forming a lithographic template as claimed in claim 5 wherein the plurality of layers includes a substrate layer and a patterning layer, the relief structure formed therein an uppermost surface of the patterning layer.
7. A method for forming a lithographic template as claimed in claim 2 wherein the step of providing a directly imageable oxide material on the relief structure of the lithographic structure and within the gap defect includes providing a directly imageable transparent dielectric.
8. A method of forming a lithographic template as claimed in claim 7 wherein the directly imageable transparent dielectric is hydrogen silsesquioxane (HSQ).
9. A method of forming a lithographic template as claimed in claim 7 wherein the directly imageable transparent dielectric is an imageable nitride.
10. A method of forming a lithographic template as claimed in claim 7 wherein the directly imageable transparent dielectric is an imageable oxynitride.
11. A method for forming a lithographic template as claimed in claim 1 wherein the step of imaging the directly imageable oxide material includes imaging the directly imageable oxide material with one of an electron beam, an x-ray radiation, an ultraviolet radiation, a deep ultraviolet radiation, or an ion beam radiation.
12. A method for forming a lithographic template as claimed in claim 7 wherein the step of trimming back excess imaged oxide present extraneous to the gap defect includes removing the excess imaged oxide material using a laser or focused ion beam (FIB).
13. A method of forming a lithographic template comprising the steps of:
providing a substrate, the substrate having an uppermost surface;
providing a patterning layer supported by the substrate;
patterning the patterning layer thereby forming a patterned relief layer having a relief structure and at least one gap defect present in the patterned relief layer;
providing a directly imageable oxide material on the patterned relief layer and within the gap defect;
imaging the directly imageable oxide material, thereby forming a layer of imaged oxide within the gap defect; and
removing any excess directly imageable oxide material from the patterned relief layer, wherein at least part of the imaged oxide layer remains in the gap defect after it has been repaired.
14. A method of forming a lithographic template as claimed in claim 13 further including the step of trimming back excess imaged oxide present extraneous to the gap defect, thereby resulting in a complete lithographic template having a repaired gap defect.
15. A method of forming a lithographic template as claimed in claim 13 , wherein the step of providing a substrate is further characterized as providing a substrate of one of a quartz material, a polycarbonate material, a calcium fluoride (CaF2) material, a magnesium fluoride (MgF2) material, or a pyrex material.
16. A method for forming a lithographic template as claimed in claim 13 further including the step of forming an etch stop layer between the surface of the substrate and the patterning layer.
17. A method for forming a lithographic template as claimed in claim 13 , wherein the step of forming a patterning layer includes forming a patterned resist layer on the surface of the patterning layer, etching the patterning layer, thereby defining an etched patterning layer, and removing the patterned resist layer.
18. A method for forming a lithographic template as claimed in claim 13 , wherein the step of forming a patterning layer is further characterized as forming a patterning layer of one of an opaque material or a transparent material.
19. A method for forming a lithographic template as claimed in claim 13 wherein the step of providing a directly imageable oxide material on the patterned relief layer and within the gap defect includes providing a directly imageable transparent dielectric.
20. A method of forming a lithographic template as claimed in claim 19 wherein the directly imageable transparent dielectric is hydrogen silsesquioxane (HSQ).
21. A method of forming a lithographic template as claimed in claim 19 wherein the directly imageable transparent dielectric is an imageable nitride.
22. A method of forming a lithographic template as claimed in claim 19 wherein the directly imageable transparent dielectric is an imageable oxynitride.
23. A method for forming a lithographic template as claimed in claim 13 wherein the step of patterning the directly imageable oxide material includes patterning the directly imageable oxide with one of an electron beam, an x-ray radiation, an ultraviolet radiation, a deep ultraviolet radiation, or an ion beam radiation.
24. A method for forming a lithographic template as claimed in claim 13 wherein the step of trimming back excess imaged oxide present extraneous to the gap defect includes removing the excess imaged oxide material using a laser or focused ion beam (FIB).
25. A lithographic template comprising:
a lithographic template having a surface;
a relief structure formed therein the surface of the lithographic template; and
a repaired gap defect formed therein the relief structure.
26. A lithographic template as claimed in claim 25 wherein the lithographic template includes a substrate formed of one of a quartz material, a polycarbonate material, a calcium fluoride (CaF2) material, a magnesium fluoride (MgF2) material, or a pyrex material.
27. A lithographic template as claimed in claim 26 wherein the lithographic template is comprised of the substrate material, having the relief structure formed therein an uppermost surface of the substrate material.
28. A lithographic template as claimed in claim 26 wherein the lithographic template is comprised of the substrate material and a patterning layer, the relief structure formed therein an uppermost surface of the patterning layer.
29. A lithographic template as claimed in claim 28 further including an etch stop layer formed on the surface of the substrate, the etch stop layer formed between the substrate and the patterning layer.
30. A lithographic template as claimed in claim 26 wherein the repaired gap defect is filled with an imaged, directly imageable oxide material.
31. A lithographic template as claimed in claim 30 wherein the directly imageable oxide material is hydrogen silsesquioxane (HSQ).
32. A lithographic template as claimed in claim 30 wherein the directly imageable oxide material is a directly imageable nitride.
33. A lithographic template as claimed in claim 30 wherein the directly imageable oxide material is a directly imageable oxynitride.
34. A method for making a device comprising the steps of:
providing a substrate;
coating the substrate with a radiation sensitive material layer;
fabricating a lithographic template; wherein the lithographic template comprises;
a lithographic template having a surface;
a relief structure formed therein the surface of the lithographic template; and
a repaired gap defect formed therein the relief structure;
positioning the lithographic template in contact with the radiation sensitive material layer, the radiation sensitive material layer being between the template and the substrate;
applying pressure to the template, the radiation sensitive material thereby flowing into the relief pattern on the template;
photoilluminating the lithographic template to expose at least a portion of the radiation sensitive material layer on the substrate, thereby further affecting the pattern in the radiation sensitive material layer; and
removing the template from the substrate.
35. A method for making a device as claimed in claim 34 wherein the repaired gap defect is filled by an imaged, directly imageable oxide material.
36. A method for making a device as claimed in claim 35 wherein the directly imageable oxide material is hydrogen silsesquioxane (HSQ).
37. A lithographic template as claimed in claim 35 wherein the directly imageable oxide material is a directly imageable nitride.
38. A method for making a device as claimed in claim 35 wherein the directly imageable oxide material is a directly imageable oxynitride.
39. A method for making a device as claimed in claim 35 wherein the step of photoilluminating the lithographic template is further characterized as transmitting one of ultraviolet light, deep ultraviolet light, or broad band light through the lithographic template.
40. A method for making a device as claimed in claim 35 wherein the radiation sensitive material layer is further characterized as coating the substrate with a photocurable material layer.
41. A method for making a device as claimed in claim 35 wherein the device is one of a semiconductor device, a microelectronic device, a micro electro mechanical device, optoelectronic, photonic, or a microfluidic device.