Granted Patent
Utility
US 6,805,742
· Confirmation No. 6778
SILICON SEMICONDUCTOR SUBSTRATE AND PROCESS FOR PRODUCING THE SAME
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-08-16 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-06-21 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-06-21 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-06-21 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 2 | View | |
| 2004-06-21 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-06-21 | FWCLM |
Index of Claims | 1 | View | |
| 2004-06-21 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-06-21 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2004-04-08 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2004-04-08 | CLM |
Claims | 8 | View | |
| 2004-04-08 | REM |
Applicant Arguments/Remarks Made in an Amendment | 2 | View | |
| 2004-01-08 | CTNF |
Non-Final Rejection | 4 | View | |
| 2004-01-08 | 1449 |
List of References cited by applicant and considered by examiner | 2 | View | |
| 2004-01-08 | FWCLM |
Index of Claims | 1 | View | |
| 2004-01-08 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2003-12-30 | SRNT |
Examiner's search strategy and results | 29 | View | |
| 2003-03-31 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 4 | View | |
| 2003-03-31 | FOR |
Foreign Reference | 20 | View | |
| 2003-03-31 | FOR |
Foreign Reference | 14 | View | |
| 2003-03-31 | FOR |
Foreign Reference | 8 | View | |
| 2002-11-19 | ABST |
Abstract | 2 | View | |
| 2002-11-19 | TRNA |
Transmittal of New Application | 2 | View | |
| 2002-11-19 | ABST |
Abstract | 1 | View | |
| 2002-09-30 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 4 | View | |
| 2002-09-30 | FOR |
Foreign Reference | 22 | View | |
| 2002-09-17 | PEFN |
Pre-Exam Formalities Notice | 1 | View | |
| 2002-08-07 | TRNA |
Transmittal of New Application | 1 | View | |
| 2002-08-07 | SPEC |
Specification | 73 | View | |
| 2002-08-07 | CLM |
Claims | 7 | View | |
| 2002-08-07 | ABST |
Abstract | 2 | View | |
| 2002-08-07 | OATH |
Oath or Declaration filed | 2 | View | |
| 2002-08-07 | PEFR |
Applicant Response to Pre-Exam Formalities Notice | 2 | View | |
| 2002-08-07 | ABST |
Abstract | 1 | View | |
| 2002-08-07 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-08-07 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-08-07 | FRPR |
Certified Copy of Foreign Priority Application | 47 | View | |
| 2002-08-07 | TRNA |
Transmittal of New Application | 1 | View | |
| 2002-08-07 | SPEC |
Specification | 73 | View | |
| 2002-08-07 | CLM |
Claims | 7 | View | |
| 2002-08-07 | ABST |
Abstract | 2 | View | |
| 2002-08-07 | OATH |
Oath or Declaration filed | 2 | View |
Inventors
Attorneys & Agents of Record
Classification
USPC
117/30
H10P95/90
C30B29/06
H10P36/20
C30B33/00
Prosecution
- Examiner
- HITESHEW, FELISA CARLA
- Art Unit
- 1765
- Customer No.
- 25889
- Docket No.
- TACHIKAWA ET AL 1
- Confirmation No.
- 6778
Foreign Priority
2001-242498
·
2001-08-09
·
JAPAN
Publication
- Pub. No.
- US20030079674A1
- Pub. Date
- 2003-05-01
Patent Term Adjustment
0days
No related applications found.
from
SILTRONIC AG
CORRECTIVE ASSIGNMENT TO CORRECT THE DATE OF THE CHANGE OF ADDRESS FROM 03/12/2020 TO 12/03/2020 PREVIOUSLY RECORDED AT REEL: 056719 FRAME: 0881. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.
Recorded 2021-07-01
CHANGE OF NAME
Recorded 2004-07-30
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2002-08-07
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Quick Facts
- Patent No.
- US 6,805,742
- App. No.
- 10/213,470
- Filed
- 2002-08-07
- Granted
- 2004-10-19
- Pub. No.
- US20030079674A1
- Examiner
- HITESHEW, FELISA CARLA
- Art Unit
- 1765
- PTA
- 0 days
External Links