Patent Application
Utility
App. No. 10/225,184
· Confirmation No. 2458
Semiconductor device employing encapsulation resin having additive reactive with ionic impurities
Abandoned -- Failure to Respond to an Office Action
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2005-04-21 | ABN |
Abandonment | 2 | View | |
| 2005-01-31 | EBCC.AD |
Notice of Change of Address Place in File Wrapper Due to Electronic Business Center(EBC) Customer Number Update | 1 | View | |
| 2004-10-05 | CTNF |
Non-Final Rejection | 9 | View | |
| 2004-10-05 | 892 |
List of references cited by examiner | 1 | View | |
| 2004-10-05 | FOR |
Foreign Reference | 12 | View | |
| 2004-10-01 | SRNT |
Examiner's search strategy and results | 2 | View | |
| 2004-09-22 | RCEX |
Request for Continued Examination (RCE) | 1 | View | |
| 2004-09-22 | XT/ |
Extension of Time | 1 | View | |
| 2004-09-22 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2004-09-22 | CLM |
Claims | 2 | View | |
| 2004-09-22 | REM |
Applicant Arguments/Remarks Made in an Amendment | 3 | View | |
| 2004-05-25 | CTFR |
Final Rejection | 13 | View | |
| 2004-05-25 | 892 |
List of references cited by examiner | 1 | View | |
| 2004-05-25 | FOR |
Foreign Reference | 16 | View | |
| 2004-05-25 | FOR |
Foreign Reference | 8 | View | |
| 2004-05-25 | FOR |
Foreign Reference | 10 | View | |
| 2004-05-25 | FOR |
Foreign Reference | 12 | View | |
| 2004-05-25 | FOR |
Foreign Reference | 5 | View | |
| 2004-05-25 | FOR |
Foreign Reference | 7 | View | |
| 2004-05-25 | FOR |
Foreign Reference | 11 | View | |
| 2004-05-23 | SRNT |
Examiner's search strategy and results | 4 | View | |
| 2004-03-27 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2004-03-27 | FWCLM |
Index of Claims | 1 | View | |
| 2004-03-08 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2004-03-08 | SPEC |
Specification | 1 | View | |
| 2004-03-08 | CLM |
Claims | 24 | View | |
| 2004-03-08 | DRW |
Drawings-only black and white line drawings | 1 | View | |
| 2004-03-08 | REM |
Applicant Arguments/Remarks Made in an Amendment | 13 | View | |
| 2004-03-08 | DRW |
Drawings-only black and white line drawings | 4 | View | |
| 2004-03-08 | XT/ |
Extension of Time | 2 | View | |
| 2003-10-06 | CTNF |
Non-Final Rejection | 10 | View | |
| 2003-10-06 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-10-06 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2003-09-21 | SRNT |
Examiner's search strategy and results | 3 | View | |
| 2003-07-07 | ELC. |
Response to Election / Restriction Filed | 2 | View | |
| 2003-06-06 | CTRS |
Requirement for Restriction/Election | 4 | View | |
| 2002-08-22 | TRNA |
Transmittal of New Application | 4 | View | |
| 2002-08-22 | SPEC |
Specification | 50 | View | |
| 2002-08-22 | CLM |
Claims | 23 | View | |
| 2002-08-22 | ABST |
Abstract | 1 | View | |
| 2002-08-22 | DRW |
Drawings-only black and white line drawings | 21 | View | |
| 2002-08-22 | OATH |
Oath or Declaration filed | 5 | View | |
| 2002-08-22 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2002-08-22 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2002-08-22 | FWCLM |
Index of Claims | 1 | View | |
| 2002-08-22 | TRNA |
Transmittal of New Application | 4 | View | |
| 2002-08-22 | DRW |
Drawings-only black and white line drawings | 21 | View | |
| 2002-08-22 | SPEC |
Specification | 50 | View | |
| 2002-08-22 | CLM |
Claims | 23 | View | |
| 2002-08-22 | ABST |
Abstract | 1 | View | |
| 2002-08-22 | OATH |
Oath or Declaration filed | 5 | View | |
| 2002-08-22 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-08-22 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-08-22 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 1 | View | |
| 2002-08-22 | FOR |
Foreign Reference | 7 | View | |
| 2002-08-22 | FOR |
Foreign Reference | 6 | View | |
| 2002-08-22 | FRPR |
Certified Copy of Foreign Priority Application | 75 | View |
Inventors
Hiromichi Suzuki
Tokyo, JAPAN
Akihiko Kameoka
Iruma, JAPAN
Masaru Yamada
Kodaira, JAPAN
Takafumi Nishita
Iruma, JAPAN
Fujio Ito
Hannou, JAPAN
Junpei Kusukawa
Hitachi, JAPAN
Ryozo Takeuchi
Hitachi, JAPAN
Toshiaki Ishii
Oomika, JAPAN
Attorneys & Agents of Record
Classification
USPC
257/666
H10W74/47
H10W76/60
H10W72/942
H10W72/07251
H10W72/884
H10W74/15
H10W72/922
H10W72/9223
H10W72/923
H10W72/20
H10W90/756
H10W74/00
H10W40/778
H10W90/724
H10W90/754
H10W72/5522
H10W72/9415
H10W90/734
H10W70/60
H10W72/5449
H10W70/456
Prosecution
- Examiner
- WILLIAMS, ALEXANDER O
- Art Unit
- 2826
- Customer No.
- 181
- Docket No.
- XA-9732
- Confirmation No.
- 2458
Foreign Priority
2001-282651
·
2001-09-18
·
JAPAN
Publication
- Pub. No.
- US20030052420A1
- Pub. Date
- 2003-03-20
No related applications found.
from
HITACHI, LTD.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-12-11
from
ITO, FUJIO,
KAMEOKA, AKIHIKO,
NISHITA, TAKAFUMI,
SUZUKI, HIROMICHI,
YAMADA, MASARU,
ISHII, TOSHIAKI,
KUSUKAWA, JUNPEI,
TAKEUCHI, RYOZO
CORRECTIVE ASSIGNMENT TO CORRECT THE SPELLING OF THE 3RD AND 7TH ASSIGNOR PREVIOUSLY RECORDED ON REEL 013212 FRAME 0548. (ASSIGNOR HEREBY CONFRIMS THE ASSIGNMENT OF THE ENTIRE INTEREST)
Recorded 2002-12-13
from
ITO, FUJIO,
KAMEOKA, AKIHIKO,
NISHITA, TAKAFUMI,
SUZUKI, HIROMICHI,
YAMADA, MASAUR,
ISHII, TOSHIAKI,
KUSUKAWA, JUNPEI,
TAKEUSHI, RYOZO
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2002-08-22
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Quick Facts
- App. No.
- 10/225,184
- Filed
- 2002-08-22
- Pub. No.
- US20030052420A1
- Examiner
- WILLIAMS, ALEXANDER O
- Art Unit
- 2826
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