System and method for Y-decoding in a flash memory device
View Patent ↗A system and method for column selection in a non-volatile memory cell array is disclosed. A group of memory cells is arranged in a rectangular array having rows (X-dimension) and columns (Y-dimension). Within a row, the sources and drains of the memory cells are connected to form a linear chain. A common word line is coupled to each gate in the row. A separate column line is coupled to each node between adjacent memory cells of the chain. A four column Y-decoder is used to select column lines for sense operations. A voltage source is applied to two of the four column lines during the sense operation. Current on one of the column lines may be sensed to provide a measurement for read or verification.
1. A non-volatile memory device comprising:
a plurality of nonvolatile memory cells arranged in a rectangular memory array having rows and columns, each said memory cell comprising a gate, a source, and a drain, wherein said memory cells are configured as a drain-source series wherein, within each said row said sources and said drains or each said memory cell are coupled to form a linear chain having a plurality of drain-source nodes, wherein each of said plurality of non-volatile memory cells comprises a uniform symmetric structure capable of storing two bits and wherein said plurality of memory cells are configured serially to form a NOR-AND (NAND) memory array or in parallel to form a NOR memory array, wherein a common word line is coupled to each said gate of said row;
a plurality of column lines including at least a first, second, third, and fourth column line, wherein each column line is coupled a drain source node;
logic for selecting a first column line from said plurality of column lines, and for coupling the selected first column line to ground;
logic for selecting a second column line from said plurality of column lines, and for coupling a first voltage source to the selected second column line;
logic for selecting a third column line from said plurality of column lines, and for coupling a second voltage source to the selected third column line, wherein said second voltage source and said first voltage source each comprise voltages that have substantially the same value and wherein said second voltage value effectively screens said first voltage source from parasitic resistances and from parasitic capacitances associated with said memory array; and
logic for selecting a fourth column line, and for allowing the selected fourth column line to float, wherein said selecting logic comprises a four column Y decoder.
2. The non-volatile memory device of claim 1 , wherein said first voltage source and said second voltage source have a voltage in the range of 1.2 to 1.4 volts.
3. The non-volatile memory device of claim 1 , wherein the selected first column line is adjacent to the selected second column line, the selected third column line is adjacent to the second selected column line, and also adjacent to the selected fourth column line.
4. The method of claim 1 , wherein said first voltage source and said second voltage source are the same.
5. A method for performing a sensing operation on the state of a non-volatile memory cell belonging to a plurality of nonvolatile memory cells configured as a drain-source series, said method comprising:
selecting a first column line and coupling said first column line to ground, wherein each of said plurality of non-volatile memory cells comprises a uniform symmetric structure capable of storing two bits, each comprising a gate, a source, and a drain, and wherein said memory cells are configured as a drain-source series having a plurality of drain-source nodes and wherein said plurality of memory cells are arranged in a rectangular memory array having rows and columns and configured serially to form a NOR-AND (NAND) memory array or in parallel to form a NOR memory array and wherein, within each said row said sources and said drains or each said memory cell are coupled to form a linear chain, wherein a common word line is coupled to each said gate of said row;
selecting a second column line adjacent to said first column line and coupling said second column line to a first voltage source;
selecting a third column line and coupling said third column line to a second voltage source, wherein said second voltage source and said first voltage source each comprise voltages that have substantially the same value and wherein said second voltage value effectively screens said first voltage source from parasitic resistances and from parasitic capacitances associated with said memory array;
selecting a fourth column line and allowing said fourth column line to float, wherein said selecting is performed with a four column Y decoder; and sensing a current supplied by said first voltage source.
6. The method of claim 5 , wherein said first voltage source and said second voltage source have a voltage in the range of 1.2 to 1.4 volts.
7. The method of claim 5 , wherein the selected first column line is adjacent to the selected second column line, the selected third column line is adjacent to the second selected column line and also adjacent to the selected fourth column line.
8. The method of claim 5 , wherein said sensing operation is a read operation.
9. The method of claim 5 , wherein said sensing operation is a verify operation.
10. The method of claim 5 , wherein said first voltage source and said second voltage source are the same.