IP Library › Patent Application 10266611
Patent Application Utility Small
App. No. 10/266,611 · Confirmation No. 7312

APERTURED PROBES FOR LOCALIZED MEASUREMENTS OF A MATERIAL'S COMPLEX PERMITTIVITY AND FABRICATION METHOD

Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
⬇ PDF
 Code Description Pages PDF
2003-11-13 LET. Miscellaneous Incoming Letter 1 View
2003-11-13 DRW Drawings-only black and white line drawings 1 View
2003-11-13 IFEE Issue Fee Payment (PTO-85B) 1 View
2002-10-09 TRNA Transmittal of New Application 2 View
2002-10-09 SPEC Specification 40 View
2002-10-09 CLM Claims 10 View
2002-10-09 ABST Abstract 1 View
2002-10-09 DRW Drawings-only black and white line drawings 8 View
2002-10-09 OATH Oath or Declaration filed 2 View
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this application's details
Quick Facts
App. No.
10/266,611
Filed
2002-10-09
Granted
2004-01-20
Pub. No.
US20030030449A1
Examiner
DEB, ANJAN K
Art Unit
2858
PTA
0 days