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App. No. 10/269,876 · Confirmation No. 6015

SENSITIVITY ADJUSTING METHOD FOR PATTERN INSPECTION APPARATUS

Inventor: Yoshikazu Nagamura
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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2004-03-22 IFEE Issue Fee Payment (PTO-85B) 1 View
2003-12-24 NOA Notice of Allowance and Fees Due (PTOL-85) 3 View
2003-12-24 NOA Notice of Allowance and Fees Due (PTOL-85) 3 View
2003-12-24 1449 List of References cited by applicant and considered by examiner 1 View
2003-12-24 892 List of references cited by examiner 1 View
2003-12-24 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2003-12-24 SRFW Search information including classification, databases and other search related notes 1 View
2003-12-13 SRNT Examiner's search strategy and results 2 View
2002-10-15 TRNA Transmittal of New Application 2 View
2002-10-15 SPEC Specification 11 View
2002-10-15 CLM Claims 2 View
2002-10-15 ABST Abstract 1 View
2002-10-15 DRW Drawings-only black and white line drawings 7 View
2002-10-15 OATH Oath or Declaration filed 3 View
2002-10-15 IDS Information Disclosure Statement (IDS) Form (SB08) 3 View
2002-10-15 FOR Foreign Reference 5 View
2002-10-15 FOR Foreign Reference 7 View
2002-10-15 FRPR Certified Copy of Foreign Priority Application 29 View
2002-10-15 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
App. No.
10/269,876
Filed
2002-10-15
Granted
2004-05-25
Pub. No.
US20030201410A1
Art Unit
2878
PTA
0 days