IP Library Patent Application 10286062
Patent Application Utility
App. No. 10/286,062 · Confirmation No. 5803

INTEGRATED CIRCUIT TESTER WITH HIGH BANDWIDTH PROBE ASSEMBLY

Inventor: Charles A. Miller
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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Code Description Pages PDF
2003-12-01 IFEE Issue Fee Payment (PTO-85B) 1 View
2003-12-01 C.AD Change of Address 1 View
2002-10-31 TRNA Transmittal of New Application 3 View
2002-10-31 A.PE Preliminary Amendment 5 View
2002-10-31 SPEC Specification 19 View
2002-10-31 CLM Claims 4 View
2002-10-31 ABST Abstract 1 View
2002-10-31 DRW Drawings-only black and white line drawings 4 View
2002-10-31 OATH Oath or Declaration filed 2 View
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Quick Facts
App. No.
10/286,062
Filed
2002-10-31
Granted
2004-02-03
Pub. No.
US20030067316A1
Art Unit
2829
PTA
-5 days