Granted Patent
Utility
US 6,793,902
· Confirmation No. 3827
SEED CRYSTAL FOR PRODUCTION OF SILICON SINGLE CRYSTAL AND METHOD FOR PRODUCTION OF SILICON SINGLE CRYSTAL
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-08-16 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-06-21 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-06-21 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 4 | View | |
| 2004-06-21 | 892 |
List of references cited by examiner | 1 | View | |
| 2004-06-21 | 1449 |
List of References cited by applicant and considered by examiner | 3 | View | |
| 2004-06-21 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-06-21 | FWCLM |
Index of Claims | 1 | View | |
| 2004-06-21 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-06-17 | SRNT |
Examiner's search strategy and results | 25 | View | |
| 2003-10-23 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 5 | View | |
| 2003-10-23 | FOR |
Foreign Reference | 19 | View | |
| 2003-05-15 | TRNA |
Transmittal of New Application | 2 | View | |
| 2003-05-15 | A.PE |
Preliminary Amendment | 30 | View | |
| 2003-05-15 | SPEC |
Specification | 27 | View | |
| 2003-05-15 | CLM |
Claims | 3 | View | |
| 2003-05-15 | ABST |
Abstract | 1 | View | |
| 2003-05-12 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 3 | View | |
| 2003-03-21 | CTMS |
Miscellaneous Action with shortened statutory period (SSP) | 1 | View | |
| 2002-12-11 | FRPR |
Certified Copy of Foreign Priority Application | 19 | View | |
| 2002-12-11 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-12-11 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-12-11 | TRNA |
Transmittal of New Application | 1 | View | |
| 2002-12-11 | SPEC |
Specification | 25 | View | |
| 2002-12-11 | CLM |
Claims | 3 | View | |
| 2002-12-11 | ABST |
Abstract | 1 | View | |
| 2002-12-11 | DRW |
Drawings-only black and white line drawings | 1 | View | |
| 2002-12-11 | OATH |
Oath or Declaration filed | 4 | View |
Inventors
Masahiro Tanaka
Yamaguchi, JAPAN
Yutaka Kishida
Yamaguchi, JAPAN
Teruyuki Tamaki
Yamaguchi, JAPAN
Hideo Kato
Yamaguchi, JAPAN
Seiki Takebayashi
Yamaguchi, JAPAN
Attorneys & Agents of Record
Classification
USPC
423/328.2
C30B29/06
C30B15/36
Prosecution
- Examiner
- HITESHEW, FELISA CARLA
- Art Unit
- 1765
- Docket No.
- TANAKA M ET AL
- Confirmation No.
- 3827
Foreign Priority
2001-388268
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2001-12-20
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JAPAN
Publication
- Pub. No.
- US20030172864A1
- Pub. Date
- 2003-09-18
Patent Term Adjustment
0days
No related applications found.
from
SILTRONIC AG
CORRECTIVE ASSIGNMENT TO CORRECT THE DATE OF THE CHANGE OF ADDRESS FROM 03/12/2020 TO 12/03/2020 PREVIOUSLY RECORDED AT REEL: 056719 FRAME: 0881. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.
Recorded 2021-07-01
CHANGE OF NAME
Recorded 2004-07-30
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2002-12-11
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Quick Facts
- Patent No.
- US 6,793,902
- App. No.
- 10/316,402
- Filed
- 2002-12-11
- Granted
- 2004-09-21
- Pub. No.
- US20030172864A1
- Examiner
- HITESHEW, FELISA CARLA
- Art Unit
- 1765
- PTA
- 0 days
External Links