IP Library Granted Patent US 7,020,374
Granted Patent B2
US 7,020,374 · App. 10/356,550 · Granted Mar 28, 2006

Optical waveguide structure and method for fabricating the same

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Quick Facts
Patent No.
US 7,020,374
App. No.
10/356,550
Granted
Mar 28, 2006
Kind
B2
Abstract

An optical waveguide structure ( 10 ) is provided. The optical waveguide structure ( 10 ) has a monocrystalline substrate ( 12 ), an amorphous interface layer ( 14 ) overlying the monocrystalline substrate ( 12 ) and an accommodating buffer layer ( 16 ) overlying the amorphous interface layer ( 14 ). An optical waveguide layer ( 20 ) overlies the accommodating buffer layer ( 16 ).

Claims (27)

1. An optical waveguide structure comprising:

a monocrystalline substrate;

an amorphous oxide material in contact with the monocrystalline substrate;

a monocrystalline metal oxide layer selected from the group consisting of alkaline earth metal titanates, alkaline earth metal zirconates, alkaline earth metal hafnates, alkaline earth metal tantalates, alkaline earth metal ruthenates, alkaline earth metal niobates, alkaline earth metal vanadates, alkaline earth metal tin-based perovskites, lanthanum aluminate, lanthanum scandium oxide, gadolinium oxide and mixtures thereof contacting the amorphous oxide material; and

an optical waveguide layer overlying said metal oxide layer,

said structure further comprising a cladding layer overlying said metal oxide layer, said optical waveguide layer disposed at least partially within said cladding layer.

2. The optical waveguide structure of claim 1 , further comprising an optical buffer layer overlying said metal oxide layer and underlying said optical waveguide layer.

3. The optical waveguide structure of claim 1 , wherein said optical waveguide layer is disposed within a window formed in said cladding layer.

4. The optical waveguide structure of claim 1 , wherein said cladding layer overlies said optical waveguide layer.

5. The optical waveguide structure of claim 1 , said monocrystalline substrate comprising one of silicon, germanium, a combination of silicon and germanium, a combination of silicon and carbon, a combination of silicon, germanium and carbon, and a silicon-on-insulator.

6. The optical waveguide structure of claim 2 , wherein said optical buffer layer comprises a dielectric material that has an index of refraction smaller than an index of refraction of a material that comprises said optical waveguide layer.

7. The optical waveguide structure of claim 6 , wherein said optical waveguide layer comprises a dielectric material having a first index of refraction and said optical buffer layer comprises a dielectric material having a second index of refraction and a difference between said first index of refraction and said second index of refraction is at least 0.1%.

8. The optical waveguide structure of claim 2 , wherein said optical buffer layer comprises one of SrTiO 3 , BaTiO 3 , Sr x Ba 1-x TiO 3 , Sr x Zr 1-x TiO 3 , where (0<x<1), PbTiO 3 , Pb x La 1-x (Zr y Ti 1-y )O 3 , where (0.7<x<1.0, 0<y<1.0), Pb(Mg 1/3 Nb 2/3 )O 3 , KNbO 3 , LiNbO 3 , LiTaO 3 , Sr x Ba 1-x Nb 2 O 6 , Pb x Ba 1-x Nb 2 O 6 , Bi 4 Ti 3 O 12 , Pb 2 KNb 5 O 15 , K 3 Li 2 Nb 5 O 15 , and substituted derivatives thereof.

9. The optical waveguide structure of claim 1 , wherein said optical waveguide layer comprises one of BaTiO 3 , PbTiO 3 , Pb x La 1-x (Zr y Ti 1-y )O 3 , where (0.7<x<1.0, 0<y<1.0), Pb(Mg 1/3 Nb 2/3 )O 3 , KNbO 3 , LiNbO 3 , LiTaO 3 , Sr x Ba 1-x Nb 2 O 6 , Pb x Ba 1-x Nb 2 O 6 , Bi 4 Ti 3 O 12 , Pb 2 KNb 5 O 15 , K 3 Li 2 Nb 5 O 15 , and substituted derivatives thereof.

10. The optical waveguide structure of claim 1 , wherein said cladding layer comprises a dielectric material that has an index of refraction that is smaller than an index of refraction of a material that comprises said optical waveguide layer.

11. The optical waveguide structure of claim 10 , wherein said optical waveguide layer comprises a dielectric material having a first index of refraction and said cladding layer comprises a dielectric material having a second index of refraction and a difference between said first index of refraction and said second index of refraction is at least 0.1%.

12. The optical waveguide structure of claim 1 , wherein said cladding layer comprises one of SrTiO 3 , BaTiO 3 , Sr x Ba 1-x TiO 3 , Sr x Zr 1-x TiO 3 , where (0<x<1), PbTiO 3 , Pb x La 1-x (Zr y Ti 1-y )O 3 , where (0.7<x<1.0, 0<y<1.0), Pb(Mg 1/3 Nb 2/3 ) 3 , KNbO 3 , LiNbO 3 , LiTaO 3 , Sr x Ba 1-x Nb 2 O 6 , Pb x Ba 1-x Nb 2 O 6 , Bi 4 Ti 3 O 12 , Pb 2 KNb 5 O 15 , K 3 Li 2 Nb 5 O 15 , and substituted derivatives thereof.

13. The optical waveguide structure of claim 1 , said monocrystalline substrate comprising silicon and said amorphous oxide comprising a silicon oxide.

14. The optical waveguide structure of claim 2 , wherein said optical buffer layer has a first lattice constant and said metal oxide layer has a second lattice constant, said second lattice constant being substantially matched to said first lattice constant.

15. The optical waveguide structure of claim 2 , wherein said optical waveguide layer has a first lattice constant and said optical buffer layer has a second lattice constant, said second lattice constant being substantially matched to said first lattice constant.

16. The optical waveguide structure of claim 1 , wherein said amorphous oxide has a thickness in the range of about 0.5 to 5 nm.

17. n optical waveguide structure comprising:

a monocrystalline substrate;

an amorphous interface layer overlying said monocrystalline substrate;

an accommodating buffer layer overlying said amorphous interface layer; and

an optical waveguide layer overlying said accommodating buffer layer,

said optical waveguide structure further comprising a cladding layer comprising one of SrTiO 3 , BaTiO 3 , Sr x Ba 1-x TiO 3 , Sr x Zr 1-x TiO 3 , where (0<x<1), PbTiO 3 , Pb x La 1-x (Zr y Ti 1-y )O 3 , where (0.7<x<1.0, 0<y<1.0), Pb(Mg 1/3 Nb 2/3 )O 3 , KNbO 3 , LiNbO 3 , LiTaO 3 , Sr x Ba 1-x Nb 2 O 6 , Pb x Ba 1-x Nb 2 O 6 , Bi 4 Ti 3 O 12 , Pb 2 KNb 5 O 15 , K 3 Li 2 Nb 5 O 15 , and substituted derivatives thereof overlying said accommodating buffer layer, said optical waveguide layer disposed at least partially within said cladding layer.

Assignments (16)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
MERGER Recorded Jan 3, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041144/0363 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
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To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0225 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →