Patent Application
Utility
App. No. 10/391,592
· Confirmation No. 8416
DEVICE FOR MEASURING TEMPERATURE OF SEMICONDUCTOR INTEGRATED CIRCUIT
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
View Patent ↗
View Publication ↗
|
⬇ PDF
|
Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-06-18 | CTMS |
Miscellaneous Action with shortened statutory period (SSP) | 2 | View | |
| 2004-06-18 | ANE.I |
Amendment After Final or under 37CFR 1.312, initialed by the examiner. | 1 | View | |
| 2004-06-18 | CLM |
Claims | 3 | View | |
| 2004-06-18 | REM |
Applicant Arguments/Remarks Made in an Amendment | 1 | View | |
| 2004-05-14 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-05-14 | A.NA |
Amendment after Notice of Allowance (Rule 312) | 1 | View | |
| 2004-05-14 | CLM |
Claims | 3 | View | |
| 2004-05-14 | REM |
Applicant Arguments/Remarks Made in an Amendment | 1 | View | |
| 2004-03-01 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-03-01 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-03-01 | 892 |
List of references cited by examiner | 2 | View | |
| 2004-03-01 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2004-03-01 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-03-01 | FWCLM |
Index of Claims | 1 | View | |
| 2004-03-01 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2003-03-20 | TRNA |
Transmittal of New Application | 2 | View | |
| 2003-03-20 | ADS |
Application Data Sheet | 4 | View | |
| 2003-03-20 | A.PE |
Preliminary Amendment | 11 | View | |
| 2003-03-20 | SPEC |
Specification | 15 | View | |
| 2003-03-20 | CLM |
Claims | 5 | View | |
| 2003-03-20 | ABST |
Abstract | 1 | View | |
| 2003-03-20 | DRW |
Drawings-only black and white line drawings | 4 | View | |
| 2003-03-20 | OATH |
Oath or Declaration filed | 3 | View | |
| 2003-03-20 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2003-03-20 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2003-03-20 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 5 | View | |
| 2003-03-20 | FOR |
Foreign Reference | 10 | View | |
| 2003-03-20 | FRPR |
Certified Copy of Foreign Priority Application | 26 | View |
Inventors
Takehiko Umeyama
Tokyo, JAPAN
Kazuyuki Ohmi
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
374/178
G01K7/01
Prosecution
- Examiner
- KAPLAN VERBITSKY, GAIL
- Art Unit
- 2859
- Customer No.
- 23548
- Docket No.
- 402557
- Confirmation No.
- 8416
Foreign Priority
2002-309490
·
2002-10-24
·
JAPAN
Publication
- Pub. No.
- US20040081224A1
- Pub. Date
- 2004-04-29
Patent Term Adjustment
-36days
No related applications found.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2004-04-07
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-09-10
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-03-20
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this application's details
Quick Facts
- App. No.
- 10/391,592
- Filed
- 2003-03-20
- Granted
- 2004-08-31
- Pub. No.
- US20040081224A1
- Examiner
- KAPLAN VERBITSKY, GAIL
- Art Unit
- 2859
- PTA
- -36 days
External Links