IP Library › Assignment 013898/0857
Patent Assignment
Reel/Frame 013898/0857

Assignment of Assignor's Interest

Recorded: 2003-03-20 Pages: 3
Assignors
UMEYAMA, TAKEHIKO
Executed: 2003-03-05
OHMI, KAZUYUKI
Executed: 2003-03-05
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO, JAPAN
Covered Property (1)
Device for Measuring Temperature of Semiconductor Integrated Circuit
Patent: 6,783,274 →
Application: 10/391,592 →
Publication: US 2004/0081224
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 10, 2003
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 014502/0289 →
Assignment of Assignor's Interest Apr 7, 2004
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 015185/0122 →