IP Library Granted Patent US 6,909,585
Granted Patent B2
US 6,909,585 · App. 10/410,420 · Granted Jun 21, 2005

Protection circuit protecting against voltage irregularities

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Quick Facts
Patent No.
US 6,909,585
App. No.
10/410,420
Granted
Jun 21, 2005
Kind
B2
Abstract

Protection circuits ( 1 ) to be located between power supplies ( 2 ) and further circuitries ( 20,30 ) for protecting further circuitries ( 20,30 ) against voltage irregularities and comprising main transistors ( 7 ) coupled to switching circuits ( 10 ) for rendering main transistors ( 7 ) operative/non-operative can be made more allround by providing them with comparators ( 11 ) for controlling gate voltages of main transistors ( 7 ) via switches ( 12,13 ) to get protection against small negative voltage pulses and voltage fluctuations. Said switches ( 12,13 ) comprise two switches ( 12,13 ) for interrupting a reference voltage generated by a reference voltage source and for supplying a nearby ground voltage to said gate. A diode ( 14 ) between switch ( 13 ) and gate allows negative voltages at said gate for simplifying the introduction of further stages. Thick oxide transistors ( 15 ) protect further circuitries ( 20,30 ) and main transistors ( 7 ) against large negative voltage pulses. Capacitors ( 16 ) and resistors ( 17 ) coupled parallelly to thick oxide transistors ( 15 ) protect against large negative voltage pulses and reverse polarity. Serial transistors ( 21 ) are coupled anti-serially to main transistors ( 7 ) to get protection against large positive voltage pulses.

Claims (18)

1. Protection circuit ( 1 ) to be located between a power supply ( 2 ) and further circuitry ( 20 , 30 ) for protecting said further circuitry ( 20 , 30 ) against voltage irregularities and comprising on input ( 3 , 4 ) to be coupled to said power supply ( 2 ) and an output ( 5 , 6 ) to be coupled to said further circuitry ( 20 , 30 ) and a main transistor ( 7 ) of which a first serial electrode is coupled to said input ( 3 ) and of which a second serial electrode is coupled to said output ( 5 ) and of which a control electrode is coupled to a switching circuit ( 10 ) for rendering said main transistor ( 7 ) operative/non-operative dependently upon an input voltage at said input ( 3 , 4 ), wherein the switching circuit ( 10 ) comprises a comparator ( 11 ) for comparing said input voltage at said input ( 3 , 4 ) with a threshold voltage (Vth) and for in dependence of comparison results controlling a control electrode voltage at said control electrode of said main transistor ( 7 ) by using at least one switch ( 12 , 13 ) to couple the control electrode to ground, or couple the control electrode to a higher reference voltage source, to switch the main transistor off or on.

2. Protection circuit ( 1 ) according to claim 1 , characterised in that said at least one switch ( 12 , 13 ) comprises a first switch ( 12 ), conductive paths of which being coupled to a reference voltage source (V 1 ) and to said control electrode of said main transistor ( 7 ), and comprises a second switch ( 13 ), conductive paths of which being coupled to ground and to said control electrode of said main transistor ( 7 ).

3. Protection circuit ( 1 ) according to claim 2 , characterised in that the switching circuit ( 10 ) comprises a diode ( 14 ) of which an anode is coupled to said control electrode of said main transistor ( 7 ) and of which a cathode is coupled to said second switch ( 13 ).

4. Protection circuit ( 1 ) according to claim 1 , wherein said comparator ( 11 ) comprises a hysteresis function.

5. Protection circuit ( 1 ) according to claim 1 , wherein the switching circuit ( 10 ) comprises a thick oxide transistor ( 15 ) of which a first serial path electrode is coupled to said input ( 3 ) and of which a second serial path electrode is coupled to said control electrode of said main transistor ( 7 ) and of which a control electrode is coupled to a further reference voltage source (V 2 ).

6. Protection circuit ( 1 ) according to claim 5 , wherein the switching circuit ( 10 ) comprises a capacitor ( 16 ) and a resistor ( 17 ) coupled in parallel across said first serial path electrode and said control electrode of said main transistor ( 7 ).

7. Protection circuit ( 1 ) according to claim 5 , wherein the output ( 5 ) of the protection circuit ( 1 ) is coupled to an input of said further circuitry ( 20 , 30 ) comprising a serial transistor ( 21 ) of which one of the serial path electrodes is coupled to said second serial path electrode of said main transistor ( 7 ) such that both serial path electrodes of both the main transistor ( 7 ) and the serial transistor ( 21 ) form an anti-serial path.

8. Protection circuit ( 1 ) according to claim 7 , wherein said further circuitry ( 20 , 30 ) comprises a voltage regulator ( 20 ) comprising said serial transistor ( 21 ).

9. Integrated circuit, wherein the integrated circuit comprises a protection circuit ( 1 ) according to claim 1 .

10. Device, wherein the device comprises a protection circuit ( 1 ) according to claim 1 .

11. Protection circuit ( 1 ) to be located between a power supply ( 2 ) and further circuitry ( 20 , 30 ) for protecting said further circuitry ( 20 , 30 ) against voltage irregularities and comprising an input ( 3 , 4 ) to be coupled to said power supply ( 2 ) and an output ( 5 , 6 ) to be coupled to said further circuitry ( 20 , 30 ) and a main transistor ( 7 ) of which a first serial electrode is coupled to said input ( 3 ) and of which a second serial electrode is coupled to said output ( 5 ) and of which a control electrode is coupled to a switching circuit ( 10 ) for rendering said main transistor ( 7 ) operative/non-operative dependently upon an input voltage at said input ( 3 , 4 ), wherein the switching circuit ( 10 ) comprises a comparator ( 11 ) for comparing said input voltage at said input ( 3 , 4 ) with a threshold voltage (Vth) and for in dependence of comparison results controlling a control electrode voltage at said control electrode of said main transistor ( 7 ) via at least one switch ( 12 , 13 ) said at least one switch ( 12 , 13 ) comprising a first switch ( 12 ), conductive paths of which are coupled to a reference voltage source (V 1 ) and to said control electrode of said main transistor ( 7 ), and a second switch ( 13 ), conductive paths of which are coupled to ground and to said control electrode of said main transistor ( 7 ), the switching circuit ( 10 ) comprising a diode ( 14 ) of which an anode is coupled to said control electrode of said main transistor ( 7 ) and of which a cathode is coupled to said second switch ( 13 ).

12. Protection circuit ( 1 ) according to claim 11 , wherein said comparator ( 11 ) comprises a hysteresis function.

13. Protection circuit ( 1 ) according to claim 11 , wherein the switching circuit ( 10 ) comprises a thick oxide transistor ( 15 ) of which a first serial path electrode is coupled to said input ( 3 ) and of which a second serial path electrode is coupled to said control electrode of said main transistor ( 7 ) and of which a control electrode is coupled to a further reference voltage source (V 2 ).

14. Protection circuit ( 1 ) according to claim 13 , wherein the switching circuit ( 10 ) comprises a capacitor ( 16 ) and a resistor ( 17 ) coupled in parallel across said first serial path electrode and said control electrode of said main transistor ( 7 ).

15. Protection circuit ( 1 ) according to claim 13 , wherein the output ( 5 ) of the protection circuit ( 1 ) is coupled to an input of said further circuitry ( 20 , 30 ) comprising a serial transistor ( 21 ) of which one of the serial path electrodes is coupled to said second serial path electrode of said main transistor ( 7 ) such that both serial path electrodes of both the main transistor ( 7 ) and the serial transistor ( 21 ) form an anti-serial path.

16. Protection circuit ( 1 ) according to claim 15 , wherein said further circuitry ( 20 , 30 ) comprises a voltage regulator ( 20 ) comprising said serial transistor ( 21 ).

17. Integrated circuit, wherein the integrated circuit comprises a protection circuit ( 1 ) according to claim 11 .

18. Device, wherein the device comprises a protection circuit ( 1 ) according to claim 11 .

Assignments (7)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
BILL OF SALE Recorded Sep 25, 2009
From: AMI SEMICONDUCTOR BELGIUM BVBA
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, L.L.C.
Reel/Frame 023282/0476 →
PATENT RELEASE Recorded Mar 21, 2008
From: CREDIT SUISSE
To: AMI SEMICONDUCTOR, INC.
Reel/Frame 020679/0505 →
SECURITY INTEREST Recorded Jun 1, 2005
From: AMI SEMICONDUCTOR, INC.
To: CREDIT SUISSE (F/K/A CREDIT SUISEE FIRST BOSTON), AS COLLATERAL AGENT
Reel/Frame 016290/0206 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 25, 2003
From: BROULIM, LUDEK; VAN ROEYEN, STEFAN
To: AMI SEMICONDUCTOR BELGIUM BVBA
Reel/Frame 014311/0613 →