Laser processing
View Patent ↗The invention provides a system and method for vaporizing a target structure on a substrate. According to the invention, a calculation is performed, as a function of wavelength, of an incident beam energy necessary to deposit unit energy in the target structure. Then, for the incident beam energy, the energy expected to be deposited in the substrate as a function of wavelength is calculated. A wavelength is identified that corresponds to a relatively low value of the energy expected to be deposited in the substrate, the low value being substantially less than a value of the energy expected to be deposited in the substrate at a higher wavelength. A laser system is provided configured to produce a laser output at the wavelength corresponding to the relatively low value of the energy expected to be deposited in the substrate. The laser output is directed at the target structure on the substrate at the wavelength corresponding to the relatively low value of the energy expected to be deposited in the substrate, in order to vaporize the target structure.
1. A system for vaporizing a target structure on a silicon substrate, comprising:
a laser pumping source;
a laser resonator cavity configured to be pumped by the laser pumping source;
a laser output system configured to produce a laser output from energy stored in the laser resonator cavity and to direct the laser output at the target structure on the silicon substrate in order to vaporize the target structure, at a wavelength below an absorption edge of the silicon substrate and below about 0.55 microns, the silicon substrate being positioned beneath the target structure with respect to the laser output, the laser output system being configured to produce the laser output at an incident beam energy;
a computer programmed to generate computer-controlled timing signals synchronized with the position of the pulsed laser beam relative to the target structure; and
an optical switch that is controllably switchable based on the timing signals so as to cause output pulses of the pulsed laser beam to be transmitted to the target structure;
wherein the incident beam energy at which the target structure is vaporized is reduced relative to an incident beam energy necessary to deposit unit energy in the target structure sufficient to vaporize the target structure at a higher wavelength below the absorption edge of the silicon substrate.
2. The system of claim 1 wherein the laser output system comprises a wavelength shifter.
3. The system of claim 1 wherein the laser resonator cavity produces laser radiation at the wavelength corresponding to the relatively low value of energy expected to be deposited in the substrate.
4. The system of claim 1 wherein the target structure comprises a metal having a conductivity greater than that of aluminum.
5. The system of claim 4 wherein the metal comprises copper.
6. The system of claim 4 wherein the metal comprises gold.
7. The system of claim 3 wherein the target structure on the substrate comprises a link of a semiconductor device.
8. The system of claim 7 wherein the semiconductor device comprises an integrated circuit.
9. The system of claim 7 wherein the semiconductor device comprises a memory device.
10. The system of claim 3 wherein the energy expected to be deposited in the substrate is substantially proportional to the incident beam energy necessary to deposit unit energy in the target structure minus the energy deposited in the target structure, multiplied by absorption of the substrate.
11. The system of claim 1 wherein the identified wavelength corresponding to a relatively low value of the energy expected to be deposited in the silicon substrate is within a visible region of spectrum.
12. The system of claim 11 wherein the identified wavelength corresponding to a relatively low value of the energy expected to be deposited in the silicon substrate is within a green region of spectrum.
13. The system of claim 1 wherein the laser output at the incident beam energy comprises short pulses.
14. The system of claim 1 wherein the laser resonator cavity is a neodymium vanadate laser resonator cavity.
15. A system for vaporizing a target structure on a silicon substrate, comprising:
a laser pumping source;
a laser resonator cavity configured to be pumped by the laser pumping source;
a laser output system configured to produce a laser output from energy stored in the laser resonator cavity and to direct the laser output at the target structure on the silicon substrate in order to vaporize the target structure, at a wavelength below an absorption edge of the silicon substrate and below about 0.55 microns, the silicon substrate being positioned beneath the target structure with respect to the laser output, the laser output system being configured to produce the laser output at an incident beam energy, the laser output comprising short pulses;
a computer programmed to generate computer-controlled timing signals synchronized with the position of the pulsed laser beam relative to the target structure; and
an optical switch that is controllably switchable based on the timing signals so as to cause output pulses of the pulsed laser beam to be transmitted to the target structure.
16. The system of claim 15 wherein the laser resonator cavity is a neodymium vanadate laser resonator cavity.
17. A system for vaporizing a target structure on a silicon substrate, comprising:
a laser pumping source;
a laser resonator cavity configured to be pumped by the laser pumping source;
a laser output system configured to produce a laser output from energy stored in the laser resonator cavity and to direct the laser output at the target structure on the silicon substrate in order to vaporize the target structure, at a wavelength below an absorption edge of the silicon substrate and below about 0.55 microns, the silicon substrate being positioned beneath the target structure with respect to the laser output, the laser output system being configured to produce the laser output at an incident beam energy;
a computer programmed to generate computer-controlled timing signals synchronized with the position of the pulsed laser beam relative to the target structure; and
an optical switch that is controllably switchable based on the timing signals so as to cause output pulses of the pulsed laser beam to be transmitted to the target structure;
wherein the incident beam energy at which the target structure is vaporized is reducible relative to an incident beam energy necessary to deposit unit energy in the target structure sufficient to vaporize the target structure at a higher wavelength below the absorption edge of the silicon substrate.
18. A method of vaporizing a target structure on a silicon substrate, comprising the steps of:
providing a laser system configured to produce a laser output at a wavelength below an absorption edge of the silicon substrate and below about 0.55 microns; and
directing the laser output at the target structure on the silicon substrate at the wavelength and at an incident beam energy, in order to vaporize the target structure, the silicon substrate being positioned beneath the target structure with respect to the laser output;
generating computer-controlled timing signals synchronized with the position of the pulsed laser beam relative to the target structure;
controllably switching an optical switch based on the timing signals so as to cause output pulses of the pulsed laser beam to be transmitted to the target structure;
wherein the incident beam energy at which the target structure is vaporized is reduced relative to an incident beam energy necessary to deposit unit energy in the target structure sufficient to vaporize the target structure at a higher wavelength below the absorption edge of the silicon substrate.
19. The method of claim 18 wherein the identified wavelength corresponding to a relatively low value of the energy expected to be deposited in the silicon substrate is within a visible region of spectrum.
20. The method of claim 19 wherein the identified wavelength corresponding to a relatively low value of the energy expected to be deposited in the silicon substrate is within a green region of spectrum.
21. The method of claim 18 wherein the laser output at the incident beam energy comprises short pulses.
22. The method of claim 18 wherein the laser system comprises a neodymium vanadate laser.
23. A method of vaporizing a target structure on a silicon substrate, comprising the steps of:
providing a laser system configured to produce a laser output at a wavelength below an absorption edge of the silicon substrate and below about 0.55 microns; and
directing the laser output at the target structure on the silicon substrate at the wavelength and at an incident beam energy, in order to vaporize the target structure, the silicon substrate being positioned beneath the target structure with respect to the laser output, wherein the laser output at the incident beam energy comprises short pulses;
generating computer-controlled timing signals synchronized with the position of the pulsed laser beam relative to the target structure; and
controllably switching an optical switch based on the timing signals so as to cause output pulses of the pulsed laser beam to be transmitted to the target structure.
24. The method of claim 23 wherein the laser system comprises a neodymium vanadate laser.
25. A method of vaporizing a target structure on a silicon substrate, comprising the steps of:
providing a laser system configured to produce a laser output at a wavelength below an absorption edge of the silicon substrate and below about 0.55 microns; and
directing the laser output at the target structure on the silicon substrate at the wavelength and at an incident beam energy, in order to vaporize the target structure, the silicon substrate being positioned beneath the target structure with respect to the laser output;
generating computer-controlled timing signals synchronized with the position of the pulsed laser beam relative to the target structure;
controllably switching an optical switch based on the timing signals so as to cause output pulses of the pulsed laser beam to be transmitted to the target structure;
wherein the incident beam energy at which the target structure is vaporized is reducible relative to an incident beam energy necessary to deposit unit energy in the target structure sufficient to vaporize the target structure at a higher wavelength below the absorption edge of the silicon substrate.