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App. No. 10/429,823 · Confirmation No. 2395

APPARATUS FOR ANALYZING A FAILURE OF A SEMICONDUCTOR DEVICE AND METHOD THEREFOR

Inventor: Ki Won Hong
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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2004-03-16 IFEE Issue Fee Payment (PTO-85B) 1 View
2003-12-31 NOA Notice of Allowance and Fees Due (PTOL-85) 3 View
2003-12-31 NOA Notice of Allowance and Fees Due (PTOL-85) 7 View
2003-12-31 892 List of references cited by examiner 1 View
2003-12-31 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2003-12-31 FWCLM Index of Claims 1 View
2003-12-31 SRFW Search information including classification, databases and other search related notes 1 View
2003-11-26 SRNT Examiner's search strategy and results 2 View
2003-05-06 TRNA Transmittal of New Application 1 View
2003-05-06 SPEC Specification 17 View
2003-05-06 CLM Claims 4 View
2003-05-06 ABST Abstract 1 View
2003-05-06 DRW Drawings-only black and white line drawings 8 View
2003-05-06 OATH Oath or Declaration filed 2 View
2003-05-06 WFEE Fee Worksheet (SB06) 1 View
2003-05-06 WFEE Fee Worksheet (SB06) 1 View
2003-05-06 FRPR Certified Copy of Foreign Priority Application 30 View
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Quick Facts
App. No.
10/429,823
Filed
2003-05-06
Granted
2004-05-04
Pub. No.
US20030208337A1
Examiner
LE, JOHN H
Art Unit
2863
PTA
0 days