IP Library Granted Patent US 6,876,185
Granted Patent B2
US 6,876,185 · App. 10/452,149 · Granted Apr 5, 2005

PLL semiconductor device with testability, and method and apparatus for testing same

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Quick Facts
Patent No.
US 6,876,185
App. No.
10/452,149
Granted
Apr 5, 2005
Kind
B2
Abstract

On a semiconductor device 20 , fabricated are a VCO 10 A, an frequency divider by integer R 21 , a frequency divider by integer (P×N+A) 22 wherein each of P, N and A is an integer, A is variable and A<N, a phase comparator 23 , and a charge pump 24 . A low pass filter 25 having been confirmed to have standard characteristics is externally added to the semiconductor device 20 to construct a PLL circuit to be tested. The frequency divider 22 is of a pulse swallow type and has a control input for setting the integer A at ones in the vicinity of a value in normal use by user. The control input is connected to external terminals D 0 and D 1 of the semiconductor device 20 for simplifying a test. The semiconductor device 20 is judged whether it is acceptable or not in quality by checking whether or not the PLL circuit enters into a locked state within a given period in each cases of A=A 1 and A=A 2 , where A 1 <A 0 <A 2 and A 0 is a value in normal use by user.

Claims (7)

1. A semiconductor device comprising constituents of a PLL circuit, said constituents including:

A VCO; and

a programmable frequency divider by integer R, said integer R being a value indicating a dividing factor of said programmable frequency divider, said programmable frequency divider by integer R receiving an incoming reference clock signal to generate a divide-by-R clock signal,

wherein said frequency divider by integer R has an external terminal receiving a signal in a test to determine said integer R at ones in the vicinity of a value in normal use by user, said ones including larger one and smaller one than said value.

2. The semiconductor device of claim 1 , wherein said constituents further including:

a phase comparator, receiving said divide-by-R clock signal and a clock signal, whose frequency is proportional to the output frequency of said VCO, to compare phases thereof, providing up and down signals, asserting said up and down signals in response to phase relation therebetween; and

a charge pump, receiving said up and down signals, having an output to charge and discharge in response to said up and down signals in order to raise and lower, respectively, said output frequency of said VCO.

Assignments (8)
CORRECTIVE ASSIGNMENT TO CORRECT THE 8647899 PREVIOUSLY RECORDED ON REEL 035240 FRAME 0429. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTERST. Recorded Nov 3, 2020
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 058002/0470 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 18, 2017
From: CYPRESS SEMICONDUCTOR CORPORATION
To: MONTEREY RESEARCH, LLC
Reel/Frame 043218/0017 →
RELEASE OF SECURITY INTEREST Recorded Jun 29, 2017
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 043062/0183 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 30, 2015
From: SPANSION, LLC
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 036036/0001 →
SECURITY INTEREST Recorded Mar 21, 2015
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 035240/0429 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2013
From: FUJITSU SEMICONDUCTOR LIMITED
To: SPANSION LLC
Reel/Frame 031205/0461 →
CHANGE OF NAME Recorded Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024982/0245 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 12, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021998/0645 →