IP Library Granted Patent US 8,602,851
Granted Patent B2
US 8,602,851 · App. 10/457,316 · Granted Dec 10, 2013

Controlled penetration subpad

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Quick Facts
Patent No.
US 8,602,851
App. No.
10/457,316
Granted
Dec 10, 2013
Kind
B2
Abstract

Provided is a seamless polishing pad comprising a seamless polishing layer having a substantially uniform depth of penetration into a porous subpad. In one embodiment, the polishing pad comprises a polishing layer produced by applying to the subpad a hardenable fluid. In another embodiment, the subpad is coated with a barrier before coating with the hardenable fluid. In each embodiment, the depth of penetration of the polishing layer and/or barrier is substantially uniform. Also provided is a method of producing a seamless polishing pad comprising a seamless polishing layer having a substantially uniform depth of penetration into a porous subpad.

Claims (14)

1. A seamless polishing pad, comprising: a porous subpad layer having a seamless polishing layer thereon, wherein said polishing layer is a hardenable fluid cast onto said subpad layer which penetrates said subpad layer to a substantially consistent uniform depth, and wherein the within belt non-uniformity of a pad compressibility as measured by durometer is less than 10 percent.

2. The seamless polishing pad according to claim 1 , wherein said seamless polishing layer is a hardenable fluid including at least one reactive molecule and at least one reaction initiator.

3. The seamless polishing pad according to claim 1 , wherein said seamless polishing layer is a hardenable fluid including a polymer dissolved in a solvent.

4. The seamless polishing pad according to claim 1 , wherein said seamless polishing layer is cast onto said subpad and cured.

5. A method of making a seamless polishing pad, comprising:

providing a porous subpad layer; and

a seamless polishing layer disposed thereon, wherein said seamless polishing layer penetrates said porous subpad layer to a substantially consistent uniform depth, and wherein the within belt non-uniformity of a pad compressibility as measured by durometer is less than 10 percent.

6. A method of making a seamless polishing pad according to claim 5 , further comprising:

introducing a barrier layer between said seamless polishing layer and said subpad layer, wherein said barrier layer and seamless polishing layer penetrate into said subpad layer to a substantially uniform depth.

7. The method of making a seamless polishing pad according to claim 6 , wherein said seamless polishing layer is cast onto said barrier layer.

8. The method of making a seamless polishing pad according to claim 5 , wherein said seamless polishing layer is coated or cast onto said subpad layer.

9. The method of making a seamless polishing pad according to claim 5 , further comprising:

introducing said subpad layer, optionally having a barrier layer disposed thereon, into a mold; and

heating said mold to a predetermined temperature and filling said mold from through a top opening, or through injection ports, to cast a hardenable fluid onto said subpad or barrier layer, thereby forming a polishing layer which penetrates into said subpad layer at a substantially uniform depth.

Assignments (4)
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 073515/0243 →
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 073517/0298 →
CHANGE OF NAME Recorded Oct 29, 2024
From: ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC.
To: DUPONT ELECTRONIC MATERIALS HOLDING, INC.
Reel/Frame 069274/0160 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 18, 2014
From: PRAXAIR S. T. TECHNOLOGY, INC.
To: ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC.
Reel/Frame 033340/0155 →