IP Library Granted Patent US 7,778,293
Granted Patent B2
US 7,778,293 · App. 10/560,462 · Granted Aug 17, 2010

Determining and setting the frequency modulation index of a laser in a CPT frequency standard

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Quick Facts
Patent No.
US 7,778,293
App. No.
10/560,462
Granted
Aug 17, 2010
Kind
B2
Abstract

A technique for determining the modulation index of a frequency-modulated laser source from the absorption spectrum that is produced when light from the laser passes through an alkali metal vapor cell. The absorption spectrum contains a primary minimum and a number of satellite minima and the modulation index is determined using ratios of the minima. The technique is used to calibrate the laser source of a CPT frequency standard so that it operates at a desired modulation index. Ways are disclosed of using the technique to calibrate the CPT frequency standard either manually or automatically. The calibration may be done when the CPT frequency standard is built, when the frequency standard is initialized, or during normal operation of the CPT frequency standard.

Claims (43)

1. A method implemented in a CPT frequency standard of using an alkali metal vapor cell to determine the modulation index of a frequency-modulated laser source, the method comprising the steps of:

modulating the laser source at a given power and a given frequency;

passing the laser light from the modulated laser source through the cell; and

determining the modulation index of the laser source from the absorption spectrum of the alkali metal vapor,

the determined modulation index being subsequently employed to calibrate the laser source to run at a desired modulation index.

2. The method set forth in claim 1 wherein:

the absorption spectrum includes a plurality of minima; and

the modulation index is determined from the minima.

3. The method set forth in claim 2 wherein:

a photodetector receives the laser light that passes through the cell; and

the minima are measured using the output of the photodetector.

4. The method set forth in either claim 2 or claim 3 wherein:

in the step of determining the modulation index, the modulation index is determined using ratios of the minima.

5. The method set forth in claim 4 wherein:

the modulation index is ambiguously determined using a ratio of first ones of the minima and disambiguated using a ratio of second ones of the minima.

6. The method set forth in claim 4 wherein:

the minima include a primary minimum and a first satellite minimum; and

the modulation index is determined using the ratio of the primary minimum and the first satellite minimum.

7. The method set forth in claim 6 wherein:

the minima include a second satellite minimum and a third satellite minimum;

the determination of the modulation index using the ratio of the primary minimum and the first satellite minimum is ambiguous; and

in the step of determining the modulation index, the ratio of the second satellite minimum and the third satellite minimum are employed to disambiguate the modulation index determined using the ratio of the primary minimum and the first satellite minimum.

8. The method set forth in claim 4 wherein:

the minima include a first satellite minimum and a second satellite minimum; and

the modulation index is determined using the ratio of the first satellite minimum and the second satellite minimum.

9. The method set forth in claim 8 wherein:

the minima include a third satellite minimum;

the determination of the modulation index using the ratio of the first satellite minimum and the second satellite minimum is ambiguous; and

in the step of determining the modulation index, the ratio of the second satellite minimum and the third satellite minimum are employed to disambiguate the modulation index determined using the ratio of the first satellite minimum and the second satellite minimum.

10. The method set forth in claim 1 wherein:

in the step of modulating the laser source, the given frequency is approximately one half that of the hyperfine separation of the alkali metal vapor in the cell.

11. A method of calibrating a frequency-modulated laser source in a CPT frequency standard to run at a desired modulation index, the light from the laser source passing through an alkali metal vapor cell in the CPT frequency source and the method comprising the steps of:

1. modulating the laser source at a given power and a given frequency;

2. determining the modulation index of the laser source from the absorption spectrum of the alkali metal vapor; and

3. repeating steps 1-2 with different given powers until the determined modulation index is the desired modulation index.

12. The method set forth in claim 11 further comprising the step of:

operating the laser source thereafter at the given modulation power that produces the desired modulation index.

13. The method set forth in claim 12 wherein:

the CPT frequency standard automatically performs the method of claim 12 .

14. The method set forth in claim 13 wherein:

the method is performed upon initialization of the CPT frequency standard.

15. The method set forth in claim 13 wherein:

the method is performed during normal operation of the CPT frequency standard.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded May 29, 2018
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MICROSEMI CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.), INC.; MICROSEMI FREQUENCY AND TIME CORPORATION; MICROSEMI COMMUNICATIONS, INC.; MICROSEMI SOC CORP.; MICROSEMI CORP. - POWER PRODUCTS GROUP; MICROSEMI CORP. - RF INTEGRATED SOLUTIONS
Reel/Frame 046251/0391 →
PATENT SECURITY AGREEMENT Recorded Feb 3, 2016
From: MICROSEMI CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC. (F/K/A LEGERITY, INC., ZARLINK SEMICONDUCTOR (V.N.) INC., CENTELLAX, INC., AND ZARLINK SEMICONDUCTOR (U.S.) INC.); MICROSEMI FREQUENCY AND TIME CORPORATION (F/K/A SYMMETRICON, INC.); MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION); MICROSEMI SOC CORP. (F/K/A ACTEL CORPORATION); MICROSEMI CORP. - POWER PRODUCTS GROUP (F/K/A ADVANCED POWER TECHNOLOGY INC.); MICROSEMI CORP. - RF INTEGRATED SOLUTIONS (F/K/A AML COMMUNICATIONS, INC.)
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037691/0697 →
RELEASE OF SECURITY INTEREST Recorded Jan 19, 2016
From: BANK OF AMERICA, N.A.
To: MICROSEMI CORPORATION; MICROSEMI CORP.-ANALOG MIXED SIGNAL GROUP, A DELAWARE CORPORATION; MICROSEMI SOC CORP., A CALIFORNIA CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC., A DELAWARE CORPORATION; MICROSEMI FREQUENCY AND TIME CORPORATION, A DELAWARE CORPORATION; MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION), A DELAWARE CORPORATION; MICROSEMI CORP.-MEMORY AND STORAGE SOLUTIONS (F/K/A WHITE ELECTRONIC DESIGNS CORPORATION), AN INDIANA CORPORATION
Reel/Frame 037558/0711 →
SECURITY AGREEMENT Recorded Apr 22, 2015
From: MICROSEMI CORPORATION; MICROSEMI CORP.-ANALOG MIXED SIGNAL GROUP; MICROSEMI SEMICONDUCTOR (U.S.) INC.; MICROSEMI SOC CORP.; MICROSEMI FREQUENCY AND TIME CORPORATION
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 035477/0057 →
CHANGE OF NAME Recorded Feb 13, 2014
From: SYMMETRICOM, INC.
To: MICROSEMI FREQUENCY AND TIME CORPORATION
Reel/Frame 032264/0195 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 21, 2012
From: KERNCO, INC.
To: SYMMETRICOM, INC.
Reel/Frame 029519/0231 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNOR'S SURNAME AND ASSIGNEE'S NAME, PREVIOUSLY RECORDED AT REEL 017384 FRAME 0296. Recorded Apr 21, 2011
From: VANIER, JACQUES
To: KERNCO, INC.
Reel/Frame 026209/0784 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 14, 2005
From: VARNIER, JACQUES
To: KEMCO, INC.
Reel/Frame 017384/0296 →