Data retention indicator for magnetic memories
View Patent ↗The present invention provides an array ( 20 ) of magnetoresistive memory elements ( 10 ) provided with at least one data retention indicator device ( 50 ). The at least one data retention indicator device ( 50 ) comprises a first magnetic element ( 51 ) and a second magnetic element ( 52 ) each having a pre-set magnetisation direction, the pre-set magnetisation direction of the first and second magnetic elements ( 51, 52 ) being different from each other. The first and second magnetic elements ( 51, 52 ) are suitable for aligning their magnetisation direction with magnetic field lines of an externally applied magnetic field exceeding a detection threshold value. According to the present invention, a parameter of the at least one data retention indicator device ( 50 ) is chosen so as to set the detection threshold value of the externally applied magnetic field to be detected. The at least one data retention indicator device ( 50 ) has a state or an output indicative of exposure of the magnetoresistive memory elements ( 10 ) of the array ( 20 ) to said externally applied magnetic field.
1. An array ( 20 ) of magnetoresistive memory elements ( 10 ) provided with at least one data retention indicator device ( 50 ) comprising a first magnetic element ( 51 ) and a second magnetic element ( 52 ) each having a pre-set magnetisation direction, the pre-set magnetisation direction of the first and second magnetic elements ( 51 , 52 ) being different from each other, the first and second magnetic elements ( 51 , 52 ) being suitable for aligning their magnetisation direction with magnetic field lines of an externally applied magnetic field exceeding a detection threshold value, wherein a parameter of the at least one data retention indicator device ( 50 ) is chosen so as to set the detection threshold value of the externally applied magnetic field to be detected, the at least one data retention indicator device ( 50 ) having a state or an output indicative of exposure of the magnetoresistive memory elements ( 10 ) of the array ( 20 ) to said externally applied magnetic field.
2. An array ( 20 ) according to claim 1 , wherein the parameter includes any or a combination of the shape, size and aspect ratio of the first and second magnetic elements ( 51 , 52 ).
3. An array ( 20 ) according to claim 1 , wherein the first and second magnetic elements ( 51 , 52 ) comprise MRAM cells.
4. An array ( 20 ) according to claim 3 , the MRAM cells having a free magnetic layer ( 12 ), wherein the MRAM cells have pre-set inverse magnetisation directions of their free magnetic layer ( 12 ).
5. An array ( 20 ) according to claim 1 , wherein the at least one data retention indicator device ( 50 ) is built adjacent to the magnetic memory elements ( 10 ) of which the data retention has to be indicated.
6. An array ( 20 ) according to claim 1 , there being a plurality of data retention indicator devices ( 50 ) spatially distributed amongst the magnetic memory element in the array ( 20 ).
7. An integrated circuit comprising an array ( 20 ) of magnetic memory elements ( 10 ) according to claim 1 .
8. An integrated circuit according to claim 7 , furthermore comprising a control circuit for generating an error signal upon indication by any of the at least one data retention indicator devices ( 50 ) of exposure of the array to an externally applied magnetic field exceeding the detection threshold value.
9. A method for indicating data retention of an array ( 20 ) of magnetic memory elements ( 10 ), the method comprising changing a pre-set magnetisation direction of a magnetic data retention indicator device when the array is exposed to an external magnetic field exceeding a pre-set magnetic field threshold voltage.