IP Library Granted Patent US 6,856,026
Granted Patent B2
US 6,856,026 · App. 10/616,981 · Granted Feb 15, 2005

Semiconductor chip, wiring board and manufacturing process thereof as well as semiconductor device

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Quick Facts
Patent No.
US 6,856,026
App. No.
10/616,981
Granted
Feb 15, 2005
Kind
B2
Abstract

A semiconductor chip which does not increase the thickness or the board area of a semiconductor device wherein semiconductor chips are layered and does not increase the wire length between the semiconductor chips even in the case that a plurality of semiconductor chips are layered on a wiring board and a process thereof, as well as a semiconductor device, and the like, are provided. The semiconductor chip has a semiconductor substrate 13 , first external electrodes 21 formed on the first surface 14 of the semiconductor substrate 13 , second external electrodes 22 formed on the second surface 17 of the semiconductor substrate 13 and through holes 16 created in the semiconductor substrate 13 , wherein the through holes 16 are provided in the inclined planes 15 formed so that the inner angles made up of the second surface 17 and the inclined planes 15 are obtuse angles and the first external electrodes 21 and the second external electrodes 22 are electrically connected through conductive patterns 19 formed so as to follow the inner walls of the through holes 16 and the inclined planes 15.

Claims (14)

1. A semiconductor chip comprising a semiconductor substrate which has a top surface on which elements are integrally formed, a rear surface which opposes to said top surface in a parallel manner, an inclined plane formed so that said top surface and the inclined plane form an acute angle and a recess which is created around said top surface and which continues to said inclined plane, wherein the semiconductor chip comprises a first electrode formed on said top surface, a second electrode formed on said rear surface and a conductive pattern which is formed within said recess and on said inclined plane and which is for connecting said first electrode and said second electrode.

2. A semiconductor chip comprising a semiconductor substrate which has a top surface on which elements are integrally formed, a rear surface which opposes to said top surface in a parallel manner, an inclined plane formed so that said top surface and the inclined plane form an acute angle and a recess which is created around said top surface and which continues to said inclined plane and has a surface electrode which is connected to said elements, wherein the semiconductor chip comprises a first insulating layer formed on the inside walls of said recess and on said top surface other than on said surface electrode, a first conductive pattern which is filled into said recess where said first insulating layer is formed and which is formed on said top surface where said first insulating layer is formed in a desired wire and electrode form so as to be connected to said surface electrode, a second insulating layer formed on said top surface with openings for an electrode part made of said first conductive pattern, an inclined part where said first conductive pattern in said recess is exposed so as to continue to said inclined plane around said rear surface, a third insulating layer formed on said rear surface and on said inclined plane with an opening for said inclined part from which said first conductive pattern is exposed, a second conductive pattern which is formed on said inclined plane where said third insulating layer is formed and on the rear surface of said semiconductor chip in a desired wire and electrode form so as to be connected to said first conductive pattern and a fourth insulating layer formed on the rear surface and on said inclined plane of said semiconductor chip with an opening for an electrode part made of said second conductive pattern.

3. A wiring board of which the base material is silicon, characterized in that a plurality of through holes are created in said wiring board, a first conductive pattern is formed on a surface of said wiring board, said through holes are created in an inclined plane formed so that the inner angle made up of a rear surface of said wiring board and the inclined plane is an obtuse angle, a second conductive pattern is formed on said rear surface and on said inclined plane and said first conductive pattern and said second conductive pattern are electrically connected through a third conductive pattern formed in said plurality of through holes.

4. A wiring board according to claim 3 , wherein an insulating layer is formed on a side surface so that the surface of the insulating layer and the surface of the substrate form a right angle.

5. A wiring board according to claim 3 , comprising a resin layer of low stress inserted either between the first conductive pattern and the substrate or between the second conductive pattern and the substrate or inserted in both cases.

6. A wiring board for a multi-chip semiconductor device on which electronic parts are mounted and which is mounted on a mother board, characterized in that said wiring board has a silicon substrate made of silicon, in that a first conductive pattern for mounting and wiring said electronic parts which is made of, at least, one layer is provided on a top surface of this silicon substrate and a second conductive pattern made of, at least, one layer which has an electrode for being mounted on said mother board is provided on a rear surface of said silicon substrate and in that said first conductive pattern and said second conductive pattern are electrically connected through a third conductive pattern formed on a side surface of said silicon substrate.

7. A wiring board according to claim 6 , comprising a resin layer of low stress inserted either between the first conductive pattern and the substrate or between the second conductive pattern and the substrate or inserted in both cases.

8. A wiring board for a multi-chip semiconductor device on which electronic parts are mounted and which is mounted on a mother board, wherein said wiring board is characterized by comprising a silicon substrate made of silicon wherein a side surface is formed so that a top surface and the side surface of the substrate form an acute angle while a recess is formed around the substrate, a first conductive pattern made of, at least, one layer having an electrode formed on the surface and within said recess of said silicon substrate and a second conductive pattern made of, at least, one layer having an electrode which is formed on the rear surface and on said side surface of said silicon substrate and which is connected to said first conductive pattern.

9. A wiring board according to claim 8 , wherein an insulating layer is formed on a side surface so that the surface of the insulating layer and the surface of the substrate form a right angle.

10. A wiring board according to claim 8 , comprising a resin layer of low stress inserted either between the first conductive pattern and the substrate or between the second conductive pattern and the substrate or inserted in both cases.

11. A semiconductor device, characterized in that a plurality of semiconductor chips, comprising semiconductor substrates, first external electrodes formed on first surfaces of said semiconductor substrates, second external electrodes formed on second surfaces of said semiconductor substrates and through holes created in said semiconductor substrates, wherein said through holes are created in inclined planes formed so that the internal angles made up of said second surfaces and the inclined planes are obtuse angles and said first external electrodes and said second external electrodes are electrically connected through conductive patterns formed so as to follow the inner walls of said through holes and said inclined planes, are layered while said respective first external electrodes and said respective second external electrodes are electrically connected.

12. A semiconductor device characterized in that between two first semiconductor chips comprising semiconductor substrates, first external electrodes formed on first surfaces of said semiconductor substrates, second external electrodes formed on second surfaces of said semiconductor substrates and through holes created in said semiconductor substrates, wherein said through holes are created in inclined planes formed so that the internal angles made up of said second surfaces and the inclined planes are obtuse angles and said first external electrodes and said second external electrodes are electrically connected through first conductive patterns formed so as to follow the inner walls of said through holes and said inclined planes, a second semiconductor chip wherein third external electrodes formed in the parts other than the region of the third surface on which elements are formed and fourth external electrodes formed in the parts other than the region of the fourth surface on which elements are formed are electrically connected through second conductive patterns is provided so that said first semiconductor chips and said second semiconductor chip are electrically connected directly or via connection members.

13. A multi-chip type semiconductor device formed by layering a plurality of semiconductor chips comprising semiconductor substrates with top surfaces on which elements are integrally formed, wherein said layered semiconductor chips comprise semiconductor substrates having said top surfaces, rear surfaces which are opposed to said top surfaces in a parallel manner, inclined planes formed so that the inclined planes and said top surfaces form acute angles and recesses created in the periphery around said top surfaces and comprise first external electrodes formed on said top surfaces, second external electrodes formed on said rear surfaces and conductive patterns formed in said recesses and on said side surfaces for connecting said first external electrodes and said second external electrodes and wherein said semiconductor chips are electrically connected to other semiconductor chips via said first external electrodes and said second external electrodes.

14. A semiconductor device according to claim 13 , wherein the layered semiconductor chips are electrically connected to other semiconductor chips directly above and directly below said semiconductor chips by directly connecting the electrodes thereof or via connection members.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Jun 11, 2020
From: ROYAL BANK OF CANADA
To: TESSERA, INC.; INVENSAS BONDING TECHNOLOGIES, INC. (F/K/A ZIPTRONIX, INC.); FOTONATION CORPORATION (F/K/A DIGITALOPTICS CORPORATION AND F/K/A DIGITALOPTICS CORPORATION MEMS); INVENSAS CORPORATION; TESSERA ADVANCED TECHNOLOGIES, INC; DTS, INC.; DTS LLC; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
Reel/Frame 052920/0001 →
SECURITY INTEREST Recorded Jun 1, 2020
From: ROVI SOLUTIONS CORPORATION; ROVI TECHNOLOGIES CORPORATION; ROVI GUIDES, INC.; TIVO SOLUTIONS INC.; VEVEO, INC.; INVENSAS CORPORATION; INVENSAS BONDING TECHNOLOGIES, INC.; TESSERA, INC.; TESSERA ADVANCED TECHNOLOGIES, INC.; DTS, INC.; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
To: BANK OF AMERICA, N.A.
Reel/Frame 053468/0001 →
SECURITY INTEREST Recorded Dec 2, 2016
From: INVENSAS CORPORATION; TESSERA, INC.; TESSERA ADVANCED TECHNOLOGIES, INC.; ZIPTRONIX, INC.; DIGITALOPTICS CORPORATION; DIGITALOPTICS CORPORATION MEMS; DTS, LLC; DTS, INC.; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
To: ROYAL BANK OF CANADA, AS COLLATERAL AGENT
Reel/Frame 040797/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 27, 2014
From: PANASONIC CORPORATION
To: INVENSAS CORPORATION
Reel/Frame 034042/0112 →
CHANGE OF NAME Recorded Dec 4, 2013
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 031765/0415 →