IP Library Granted Patent US 7,248,069
Granted Patent B2
US 7,248,069 · App. 10/638,795 · Granted Jul 24, 2007

Method and apparatus for providing security for debug circuitry

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Quick Facts
Patent No.
US 7,248,069
App. No.
10/638,795
Granted
Jul 24, 2007
Kind
B2
Abstract

The invention relates to debug circuitry ( 20 ) and more particularly to a method and apparatus for providing security for debug circuitry ( 20 ). In one embodiment, a plurality of non-volatile elements ( 38 ) are used in providing selective disabling and re-enabling of at least a portion of the debug circuitry ( 20 ). Authentication may also be used. The present invention may use any debug interface, including standard debug interfaces such as the JTAG debug interface defined by the IEEE.

Claims (39)

1. A method for providing security for debug circuitry, comprising:

providing the debug circuitry, wherein the debug circuitry is enabled;

programming a first nonvolatile element to disable the debug circuitry; and

after programming the first nonvolatile element, programming a second nonvolatile element to perform one of re-enabling the debug circuitry and permanently disabling the debug circuitry.

2. The method of claim 1 , wherein, after programming the first nonvolatile element and prior to programming the second nonvolatile element, the debug circuitry is capable of being selectively enabled in response to authentication.

3. The method of claim 1 , wherein the second nonvolatile element is programmed to re-enable the debug circuitry.

4. The method of claim 3 , further comprising:

after programming the second nonvolatile element, programming a third nonvolatile element to disable debug, wherein after programming the third nonvolatile element, the debug circuitry is capable of being selectively enabled in response to authentication.

5. The method of claim 4 , wherein the first nonvolatile element comprises a first fuse, the second nonvolatile element comprises a second fuse, and the third nonvolatile element comprises a third fuse, and wherein:

programming the first nonvolatile element comprises blowing the first fuse;

programming the second nonvolatile element comprises blowing the second fuse; and

programming the third nonvolatile element comprises blowing the third fuse.

6. The method of claim 4 , further comprising:

after programming the third nonvolatile element, programming a fourth nonvolatile element to permanently disable the debug circuitry.

7. The method of claim 1 , wherein the second nonvolatile element is programmed to permanently disable the debug circuitry.

8. The method of claim 1 , wherein the first nonvolatile element comprises a first fuse and the second nonvolatile element comprises a second fuse, and wherein programming the first nonvolatile element comprises blowing the first fuse and wherein programming the second nonvolatile element comprises blowing the second fuse.

9. A method for providing security for debug circuitry, comprising:

providing the debug circuitry in a secure debug state in which the debug circuitry is capable of being selectively enabled in response to authentication;

enabling the debug circuitry in response to authentication; and

after enabling the debug circuitry in response to authentication, programming a first nonvolatile element

after programming the first nonvolatile element, programming a second nonvolatile element, wherein, after programming the second nonvolatile element, the debug circuitry is in a re-enabled secure debug state in which the debug circuitry is capable of being selectively enabled in response to authentication.

10. The method of claim 9 , wherein, after programming the first nonvolatile element, the debug circuitry is in a bypass security state in which the debug circuitry is enabled.

11. The method of claim 9 , wherein the first nonvolatile element comprises a first fuse and the second nonvolatile element comprises a second fuse, and wherein programming the first nonvolatile element comprises blowing the first fuse and wherein programming the second nonvolatile element comprises blowing the second fuse.

12. The method of claim 9 , further comprising:

after programming the second nonvolatile element, programming a third nonvolatile element to permanently disable the debug circuitry.

13. An integrated circuit, comprising:

debug circuitry;

a first nonvolatile element;

a second nonvolatile element; and

debug enable circuitry which provides a debug enable indicator to the debug circuitry based on the first and second nonvolatile elements, wherein:

the first nonvolatile element indicates whether or not the debug circuitry is in a secure debug state in which the debug circuitry can be selectively enabled in response to authentication; and

the second nonvolatile element indicates whether or not to override the first nonvolatile element.

14. The integrated circuit of claim 13 , wherein the second nonvolatile element indicates whether or not to override the first nonvolatile element by indicating whether or not the debug circuitry is in a bypass security state in which the debug circuitry is re-enabled.

15. The integrated circuit of claim 14 , further comprising a third nonvolatile element that indicates whether or not to override the second nonvolatile element.

16. The integrated circuit of claim 15 , wherein the third nonvolatile element indicates whether or not to override the second nonvolatile element by indicating whether or not the debug circuitry is in a re-enabled secure debug state in which the debug circuitry can be selectively enabled in response to authentication.

17. The integrated circuit of claim 16 , further comprising a fourth nonvolatile element that indicates whether or not the debug circuitry is permanently disabled.

18. The integrated circuit of claim 15 , wherein the third nonvolatile element indicates whether or not to override the second nonvolatile element by indicating whether or not the debug circuitry is permanently disabled.

19. The integrated circuit of claim 13 , wherein the second nonvolatile element indicates whether or not to override the first nonvolatile element by indicating whether or not the debug circuitry is permanently disabled.

20. The integrated circuit of claim 13 , wherein the first nonvolatile element comprises a first fuse and the second nonvolatile element comprises a second fuse.

Assignments (25)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0225 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0704 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
RELEASE OF SECURITY INTEREST Recorded Jan 23, 2015
From: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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RELEASE OF SECURITY INTEREST Recorded Jan 23, 2015
From: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 034799/0664 →
RELEASE OF SECURITY INTEREST Recorded Jan 23, 2015
From: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 23, 2015
From: FREESCALE SEMICONDUCTOR, INC.
To: INTEL CORPORATION
Reel/Frame 034802/0847 →
RELEASE OF SECURITY INTEREST Recorded Jan 23, 2015
From: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024397/0001 →
SECURITY AGREEMENT Recorded Feb 16, 2008
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
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SECURITY AGREEMENT Recorded Feb 2, 2007
From: FREESCALE SEMICONDUCTOR, INC.; FREESCALE ACQUISITION CORPORATION; FREESCALE ACQUISITION HOLDINGS CORP.; FREESCALE HOLDINGS (BERMUDA) III, LTD.
To: CITIBANK, N.A. AS COLLATERAL AGENT
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 11, 2003
From: MOYER, WILLIAM C.; TKACIK, THOMAS E.
To: MOTOROLA, INC.
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