IP Library Granted Patent US 7,261,230
Granted Patent B2
US 7,261,230 · App. 10/652,434 · Granted Aug 28, 2007

Wirebonding insulated wire and capillary therefor

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Quick Facts
Patent No.
US 7,261,230
App. No.
10/652,434
Granted
Aug 28, 2007
Kind
B2
Abstract

An improved method of bonding an insulated wire ( 14 ) that has one end connected to a first bond pad ( 16 ) to a second bond pad ( 18 ) includes moving a tip of a capillary ( 20 ) holding the bond wire ( 14 ) over the surface of the second bond pad ( 18 ) such that the bond wire ( 14 ) is rubbed between the capillary tip ( 20 ) and the second bond pad ( 18 ), which tears the bond wire insulation so that at least a portion of a metal core of the wire ( 14 ) contacts the second bond pad ( 18 ). The wire ( 14 ) is then bonded to the second pad ( 18 ) using thermocompression bonding. The tip of the capillary ( 20 ) is roughened to enhance the tearing of the bond wire insulation.

Claims (30)

1. A method of electrically connecting a first device to a second device with an insulated wire, the method comprising the steps of:

forming a first bond by wirebonding a first end of the insulated wire to a first bond pad of the first device, thereby electrically connecting the bond wire and the first device;

moving a tip of a capillary holding the bond wire over the surface of second bond pad of the second device such that the bond wire is rubbed between the capillary tip and the second bond pad horizontally thereby tearing the bond wire insulation so that at least a portion of a metal core of the wire contacts the second bond pad, wherein the capillary has a roughened tip that enhances abrasion of the insulation during said moving step; and

bonding at least the exposed portion of the bond wire to the second bond pad via thermocompression bonding, thereby electrically connecting the first device and the second device.

2. The electrical connection method of claim 1 , wherein the moving step includes moving the capillary tip such that the capillary movement has a combination of a positive shift movement in a first direction over the second bond pad and a negative shaft movement move in a second direction over the second bond pad.

3. The electrical connection method of claim 1 , wherein the bonding step includes thermocompression bonding and a very low amount of ultrasonic energy.

4. The electrical connection method of claim 1 , wherein the first bond comprises a ball bond.

5. The electrical connection method of claim 4 , wherein the second bond comprises a stitch bond.

6. The electrical connection method of claim 1 , wherein the second device comprises a carrier and the second bond pad is a lead finger.

7. The electrical connection method of claim 1 , further comprising the step of heating the second bond pad prior to said moving step.

8. The electrical connection method of claim 1 , wherein the insulated wire comprises one of a gold, copper or aluminum wire having an organic insulative coating.

9. The electrical connection method of claim 8 , wherein the insulated wire has a diameter of less than about 25 um.

10. The electrical connection method of claim 9 , wherein the insulative coating has a thickness of about 0.5 um to 2.0 um.

11. An improved method of bonding an insulated wire having one end connected to a first bond pad to a second bond pad, the improved method comprising the steps of:

moving a tip of a capillary holding the bond wire over the surface of the second bond pad such that the bond wire is rubbed between the capillary tip and the second bond pad, thereby tearing the bond wire insulation so that at least a portion of a metal core of the wire contacts the second bond pad, wherein the capillary has a roughened tip that enhances abrasion of the insulation during said moving step; and

bonding the exposed portion of the bond wire to the second bond pad via thermocompression bonding.

12. The electrical connection method of claim 11 , wherein the moving step includes moving the capillary tip such that the capillary movement has a combination of a positive shift movement in a first direction over the second bond pad and a negative shift movement move in a second direction over the second bond pad.

13. The electrical connection method of claim 11 , wherein the thermocompression bonding uses a very small amount of ultrasonic energy.

14. The electrical connection method of claim 11 , wherein the second bond comprises a stitch bond.

15. The electrical connection method of claim 14 , wherein the second bond pad comprises a carrier finger.

16. The electrical connection method of claim 11 , further comprising the step of heating the second bond pad prior to said moving step.

17. The electrical connection method of claim 11 , wherein the insulated wire comprises one of a gold, copper or aluminum wire having an organic insulative coating.

18. The electrical connection method of claim 17 , wherein the insulated wire has a diameter of less than about 25 um and the insulative coating has a thickness of about 0.5 um to 2.0 um.

19. An improved method of bonding an insulated wire having one end connected to a first bond pad to a second bond pad, the improved method comprising the steps of:

providing a capillary having a roughened tip for holding the insulated wire;

moving the tip of the capillary over a surface of the second bond pad such that the wire is rubbed between the capillary tip and the second bond pad, thereby tearing the insulation so that at least a portion of a metal core of the wire contacts the second bond pad; and

bonding the exposed portion of the wire to the second bond pad via thermocompression bonding.

20. The electrical connection method of claim 19 , further comprising the step of heating the second bond pad prior to said moving step.

21. The electrical connection method of claim 19 , wherein the insulated wire comprises one of a gold, copper or aluminum wire having an organic insulative coating.

22. The electrical connection method of claim 21 , wherein the insulated wire has a diameter of less than about 25 um and the insulative coating has a thickness of about 0.5 um to 2.0 um.

Assignments (19)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE LISTED CHANGE OF NAME SHOULD BE MERGER AND CHANGE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0180. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 12, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040652/0180 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0225 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0704 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →