Memory device for rapid data access from memory cell

1. A semiconductor memory device having sense amplifier array blocks between neighboring unit memory cell array blocks in a column direction, the semiconductor memory device comprising:

a first sense amplifier driving line configured by passing the sense amplifiers in a row direction;

a second sense amplifier driving line configured by passing the sense amplifiers in a row direction;

a plurality of first NMOS transistors, which are disposed in the sense amplifier array block, for locally performing a pull-up operation of the first sense amplifier driving line in response to a first control signal; and

a second NMOS transistor, which is disposed in a hole area, for performing a pull-down operation of the second sense amplifier driving line in response to a second control signal.

2. The semiconductor memory device as recited in claim 1 , wherein the second NMOS transistor has a relatively large size to have a drivability to perform the pull-down operation of the second sense amplifier driving line against a resistance of the second amplifier driving line, and a size of the first NMOS transistor is smaller than that of the second NMOS transistor.

3. The semiconductor memory device as recited in claim 2 , further comprising a third NMOS transistor, which is disposed in the hole area, for performing the pull-up operation of the first sense amplifier driving line in the response to the first control signal.

4. The semiconductor memory device as recited in claim 3 , wherein the third NMOS transistor has a smaller size than the second NMOS transistor.

5. The semiconductor memory device as recited in claim 1 , wherein each first NMOS transistor is disposed for a set of two sense amplifiers in the sense amplifier array block.

6. The semiconductor memory device as recited in claim 1 , wherein a gate extension direction of transistors configuring the sense amplifiers is substantially perpendicular to a gate extension direction of the first NMOS transistors.

7. A semiconductor memory device having sense amplifier array blocks between neighboring unit memory cell array blocks in a column direction, the semiconductor memory device comprising:

a first sense amplifier driving line configured by passing the sense amplifiers in a row direction;

a second sense amplifier driving line configured by passing the sense amplifiers in a row direction;

a plurality of first NMOS transistors, which is disposed in the sense amplifier array block, for locally performing a pull-up operation of the first sense amplifier driving line in response to a first control signal; and

a plurality of second NMOS transistors, which is disposed in the sense amplifier array block, for locally performing a pull-down operation of the second sense amplifier driving line in response to a second control signal.

8. The semiconductor memory device as recited in claim 7 , further comprising a third NMOS transistor, which is disposed in the hole area, for performing the pull-up operation of the first sense amplifier driving line in the response to the first control signal.

9. The semiconductor memory device as recited in claim 8 , further comprising a fourth NMOS transistor, which is disposed in the hole area, for performing the pull-down operation of the second sense amplifier driving line in the response to the second control signal.

10. The semiconductor memory device as recited in claim 9 , wherein the third and fourth NMOS transistor have a smaller size than the first and second NMOS transistor, respectively.

11. The semiconductor memory device as recited in claim 9 , wherein one first NMOS transistor and one second NMOS transistor are disposed for a set of two sense amplifier in the sense amplifier array block.

12. The semiconductor memory device as recited in claim 7 , wherein a gate extension direction of transistors configuring the sense amplifiers is substantially perpendicular to a gate extension direction of the first and second NMOS transistors.